2011
DOI: 10.1016/j.optlaseng.2010.10.002
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Evaluation of the piezoelectric behaviour produced by a thick-film transducer using digital speckle pattern interferometry

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Cited by 5 publications
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“…These phase maps are proportional to the out-of-plane displacement produced by the arrival of the successive wavefronts and, with the assumptions made in our model [2], also to the acoustic wave that emerges at the measurement plane. Optical methods have been applied to the study of the surface displacements of transducers and piezoelectric films [3,4], but the emitters are analyzed only when uncoupled, whereas the method proposed herein allows to perform the measurements under the actual working conditions of the transducer.…”
Section: Introductionmentioning
confidence: 99%
“…These phase maps are proportional to the out-of-plane displacement produced by the arrival of the successive wavefronts and, with the assumptions made in our model [2], also to the acoustic wave that emerges at the measurement plane. Optical methods have been applied to the study of the surface displacements of transducers and piezoelectric films [3,4], but the emitters are analyzed only when uncoupled, whereas the method proposed herein allows to perform the measurements under the actual working conditions of the transducer.…”
Section: Introductionmentioning
confidence: 99%
“…[14] The experimental data, with few exceptions, [3] are acoustic pressure measurements performed in water with scanning hydrophones. Optical methods have also been investigated to measure directly the motion of the surface of transducers and piezoelectric films, either with the transducer totally uncoupled, [15,16] or immersed in water, though in this case NOMENCLATURE 2-D two-dimensional 3-D three-dimensional c L phase velocity of compression acoustic waves in the material d reconstruction distance D diameter of the specimen h thickness of the specimen j imaginary unit k a wavenumber of the acoustic wave f a central frequency of the acoustic excitation N number of optical phase-change maps in a experiment n index that identifies the position of a given map within a sequence Si identification label for each specimen (i ¼ 1, . .…”
Section: Introductionmentioning
confidence: 99%