2011
DOI: 10.1134/s1063783411120171
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Evaluation of the energy distribution of trap states in polymer films

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Cited by 8 publications
(3 citation statements)
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“…Comparing the results of the analysis of the rearranged curves with the data obtained by other methods, it can be noted that the results correlate with the previously studied ones by traditional techniques of TSC, TSD and optical measurements [8,9] (Fig. 3).…”
Section: Resultssupporting
confidence: 82%
“…Comparing the results of the analysis of the rearranged curves with the data obtained by other methods, it can be noted that the results correlate with the previously studied ones by traditional techniques of TSC, TSD and optical measurements [8,9] (Fig. 3).…”
Section: Resultssupporting
confidence: 82%
“…In a several papers [ 42 , 43 ], it has been experimentally shown that it is possible to form deep electronic states and a narrow conduction band near the Fermi level in thin dielectric films. In [ 42 ], this conclusion was based on the analysis of the current-voltage characteristics measured near the dielectric-conductor junction within the framework of the injection current model [ 44 ].…”
Section: Methodsmentioning
confidence: 99%
“…Three types of electron traps at energies of 0.5, 1.06, and 2.4 eV from the bottom of the conduction band have been identified in PDP films [9]. The depths of the above chemical electron traps in a poly mer film, with inclusion of the polarization energy calcu lated as described in [10], are ~1.7, ~1.2, and ~2.4 eV (table) for the anthrone (and "open" phthalide), "closed" phthalide, and anthraquinone groups, respectively.…”
mentioning
confidence: 99%