A decrease in diode sensitivity occurs with a decrease in the average dose rate, which corresponds to an increase in the pulse period of radiation. The sensitivity decrease is modeled by an empirical exponential function that decreases with an effective lifetime, t(eff), of 1.0-14 s. t(eff) varies widely for different diodes, dpp, and x-ray energy. It is hypothesized that the capture of excess minority carriers by charge traps, cause the observed decrease in diode sensitivity. Also, it is hypothesized that the slow reopening of these traps occurs in the hundreds of milliseconds to seconds range at ambient temperature and this underlies the slow decrease in the diode sensitivity. Calibration of a diode is best done at the average dose rate with which it will be used. This is easily accomplished for radiation deliveries in which the average dose rate is a constant. However, for a VMAT delivery the average dose rate is a variable. For measurements made under these conditions diodes can be calibrated with a median or average dose rate which splits the difference in diode sensitivity that is known to occur with changes in average dose rate.