“…At the GB, the carriers have to hop over the barriers. As the temperature rises, the barrier height is lowered, and therefore, the mobility of polysilicon increases [5,11] . Seto's [10] experimental data shows that for doping concentration less than 1 × 10 19 cm −3 , the mobility decreases exponentially with 1/kT.…”
Section: Modeling Of the Self-heating Effectmentioning
confidence: 99%
“…where I D is the drain current, and R th is the thermal resistance of the device. R th is strongly dependent on the substrate materials and the TFT structure [5,11] . It is obvious that the glass substrate is very important for the self-heating [12] .…”
Section: Modeling Of the Self-heating Effectmentioning
confidence: 99%
“…Therefore, like SOI devices, high performance poly-Si TFTs exhibit a negative output conductance in the saturation current when operated at high gates and drain biases [3,4] . However at a low gate bias, the drain current monotonously increases as the temperature is increased [4,5] . Self-heating related reliability has also been investigated elsewhere [6,7] .…”
An analytical DC model accounting for the self-heating effect of polycrystalline silicon thin-film transistors (poly-Si TFTs) is presented. In deriving the model for the self-heating effect, the temperature dependence of the effective mobility is studied in detail. Based on the mobility model and a first order approximation, a closed-form analytical drain current model considering the self-heating effect is derived. Compared with the available experimental data, the proposed model, which includes the self-heating and kink effects, provides an accurate description of the output characteristics over the linear, the saturation, and the kink regimes.
“…At the GB, the carriers have to hop over the barriers. As the temperature rises, the barrier height is lowered, and therefore, the mobility of polysilicon increases [5,11] . Seto's [10] experimental data shows that for doping concentration less than 1 × 10 19 cm −3 , the mobility decreases exponentially with 1/kT.…”
Section: Modeling Of the Self-heating Effectmentioning
confidence: 99%
“…where I D is the drain current, and R th is the thermal resistance of the device. R th is strongly dependent on the substrate materials and the TFT structure [5,11] . It is obvious that the glass substrate is very important for the self-heating [12] .…”
Section: Modeling Of the Self-heating Effectmentioning
confidence: 99%
“…Therefore, like SOI devices, high performance poly-Si TFTs exhibit a negative output conductance in the saturation current when operated at high gates and drain biases [3,4] . However at a low gate bias, the drain current monotonously increases as the temperature is increased [4,5] . Self-heating related reliability has also been investigated elsewhere [6,7] .…”
An analytical DC model accounting for the self-heating effect of polycrystalline silicon thin-film transistors (poly-Si TFTs) is presented. In deriving the model for the self-heating effect, the temperature dependence of the effective mobility is studied in detail. Based on the mobility model and a first order approximation, a closed-form analytical drain current model considering the self-heating effect is derived. Compared with the available experimental data, the proposed model, which includes the self-heating and kink effects, provides an accurate description of the output characteristics over the linear, the saturation, and the kink regimes.
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