2015
DOI: 10.1007/s11340-015-0008-2
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Evaluation of Interfacial Fracture Strength in Micro-Scale Components Combined with High-Voltage Environmental Electron Microscopy

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Cited by 13 publications
(5 citation statements)
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“…A gold thin wire was attached on the stage and approached a diamond tip on the opposite side. The root of the tip was connected with a silicon-fabricated force sensor [66]. The load-displacement curves were constructed from signals of the force sensor and from the displacement of the piezo actuator.…”
Section: Various Kinds Of Application Resultsmentioning
confidence: 99%
“…A gold thin wire was attached on the stage and approached a diamond tip on the opposite side. The root of the tip was connected with a silicon-fabricated force sensor [66]. The load-displacement curves were constructed from signals of the force sensor and from the displacement of the piezo actuator.…”
Section: Various Kinds Of Application Resultsmentioning
confidence: 99%
“…For instance, TEM observations or mechanical tests of a microstructure containing a single grain boundary (e.g., micropillars 19) and microbending beams 20,21) ) would be useful for this purpose.…”
Section: Discussionmentioning
confidence: 99%
“…The acceleration voltage of TEM was 1000 kV, and digital image recording was done at 30 frames/s. For more details of the experimental setups, see references (Tanaka et al, 2013, Takahashi et al, 2015.…”
Section: Methodsmentioning
confidence: 99%
“…These studies generally claim the validity of the criterion; the nucleation of interfacial fracture from the free-edge is governed by the near-edge singular stress field that extends less than 100 nm. On the other hand, our recent survey on a number of Si/Cu micro-components shows that the fracture strength expressed by the near-edge stress is too scattered to make a reliable judgement of environmental effect (Takahashi et al, 2015). These contradicting results motivated the authors to revisit the strength properties of the Si/Cu free-edge.…”
Section: Introductionmentioning
confidence: 99%