Evaluation of Ferroelectric Properties of Piezoelectric Ceramics Based on Crystallographic Homogenization Method and Crystal Orientation Analysis by SEM·EBSD Technique

Uetsuji, Yasutomo; Yoshida, Toshihiro; Yamakawa, Takayuki; Tsuchiya, Kazuyoshi; Ueda, Sei; Nakamachi, Eiji

doi:10.1299/jsmea.49.209

Cited by 5 publications

(1 citation statement)

References 5 publications

(5 reference statements)

Supporting

Mentioning

Contrasting

Order By: Relevance

“…In our previous studies, we have analyzed the microstructure of BaTiO 3 [29,30] and PZT [31] by mean of EBSD. We focused on polycrystalline piezoelectric ceramics because they have most diffi cult microstructure for numerical modeling.…”

Section: Introductionmentioning

confidence: 99%

Electron backscatter diffraction crystal morphology analysis and multiscale simulation of piezoelectric materials

Uetsuji¹,

Kuramae²,

Tsuchiya³

et al. 2013

Int. J. CMEM

View full text Add to dashboard Cite

A computational approach based on electron backscatter diffraction (EBSD) measurement was proposed to estimate the effects of crystal morphology on the overall response of polycrystalline piezoelectric ceramics. EBSD-measured crystal orientations of a polycrystalline piezoelectric ceramic, barium titanate, were applied to a multiscale fi nite element simulation based on asymptotic homogenization theory. First, the orientation dependence of material properties, such as elastic compliance constants, dielectric and piezoelectric strain constants, was discussed for a single-domain crystal of tetragonal perovskite structure. The computation indicated that piezoelectric strain constants are more sensitive to crystal orientation compared with other properties. Then the single-crystalline material properties were introduced into multidirectionally oriented grains in the polycrystalline microstructure, the multiscale fi nite element analysis between macrostructure and EBSD-measured microstructure was performed. In this paper emphasis was placed on the diminution of microstructure. The authors discussed about the adverse effect on each component of macrostructural homogenized material properties, which is useful for micromechanics approaches.

show abstract

Section: Introductionmentioning

confidence: 99%

Electron backscatter diffraction crystal morphology analysis and multiscale simulation of piezoelectric materials

Uetsuji¹,

Kuramae²,

Tsuchiya³

et al. 2013

Int. J. CMEM

View full text Add to dashboard Cite

show abstract

Exploring photo-deformation of polydomain liquid crystal polymers by homogenization

Chen

Huo

2019

Soft Materials

View full text Add to dashboard Cite

Multiscale finite element simulations of piezoelectric materials based on two- and three-dimensional electron backscatter diffraction–measured microstructures

Uetsuji

Kimura

Kuramae

et al. 2012

Journal of Intelligent Material Systems and Structures

Self Cite

View full text Add to dashboard Cite

This article presents a computational procedure for evaluating effective homogenized material properties of polycrystalline piezoelectric materials and constructing two- and three-dimensional realistic microstructure models based on electron backscatter diffraction crystal orientation measurement. Microstructural features of a polycrystalline piezoelectric material, barium titanate, were investigated through electron backscatter diffraction measurements using an amorphous osmium coating to prevent charging. Realistic crystal orientations obtained from the electron backscatter diffraction measurements were introduced into multiscale finite element simulations based on homogenization theory to reveal the relationship between the macrostructure and the microstructure. First, a two-dimensional microstructural model was constructed, and the effect of the sampling area of the electron backscatter diffraction–measured crystal orientations was analyzed. We discuss the representative volume element determined from two points of view: the macroscopic homogenized material properties and the microscopic localized material behavior in response to external loads. Second, the surface of specimen was ground and polished at regular intervals and was measured by electron backscatter diffraction iteratively. Then a three-dimensional microstructural model was constructed by stacking in-plane crystal orientations in series along the out-of-plane direction, and the influence of the microstructural thickness, which indicates the stacking dimension in the out-of-plane direction, was investigated. We compare the macrostructural homogenized material properties between the two- and three-dimensional microstructures.

show abstract

Evaluation of Ferroelectric Properties of Piezoelectric Ceramics Based on Crystallographic Homogenization Method and Crystal Orientation Analysis by SEM·EBSD Technique

Cited by 5 publications

References 5 publications

Electron backscatter diffraction crystal morphology analysis and multiscale simulation of piezoelectric materials

Electron backscatter diffraction crystal morphology analysis and multiscale simulation of piezoelectric materials

Exploring photo-deformation of polydomain liquid crystal polymers by homogenization

Multiscale finite element simulations of piezoelectric materials based on two- and three-dimensional electron backscatter diffraction–measured microstructures

Contact Info

Product

Resources

About