2009
DOI: 10.1144/1467-7873/09-205
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Evaluation of a total reflection X-ray fluorescence spectrometer in the determination of arsenic and trace metals in environmental samples

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Cited by 13 publications
(11 citation statements)
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“…The x-ray scanning time can vary depending on the desired accuracy. Longer scan times provide better precision and accuracy (Juvonen et al, 2009). We recommend a scan time of at least 120 s.…”
Section: Pxrf Results At Different Moisture Levelsmentioning
confidence: 99%
See 1 more Smart Citation
“…The x-ray scanning time can vary depending on the desired accuracy. Longer scan times provide better precision and accuracy (Juvonen et al, 2009). We recommend a scan time of at least 120 s.…”
Section: Pxrf Results At Different Moisture Levelsmentioning
confidence: 99%
“…Elemental concentrations are measured by an x-ray fluorescence spectrometer, included in the device. The determined energy of the radiation is specific for each element, and the amount of radiation is related to the concentration of an element in the sample (Juvonen et al, 2009). The x-ray energies of elements lighter than magnesium (Mg) are considered too low for effective pXRF analysis.…”
Section: Portable Xrf Instrumentmentioning
confidence: 99%
“…) are rather high for the quantitative determination of low concentrations of analytes. In analyzing low‐mineralized waters, the sample is often concentrated directly on the reflector by its multiple pipetting . At the same time, it is noted that this procedure sometimes results in a nonuniform distribution of the substance on the carrier .…”
Section: Resultsmentioning
confidence: 99%
“…Juvoven R. и др [133] с помощью микроскопа продемонстрировали подобные результаты, сравнивая сухие остатки воды, полученные после нанесения 20 мкл, 20 мкл × 2, 20 мкл × 3 и 20 мкл × 4.…”
Section: приготовление излучателей к рфа пвоunclassified
“…В ряде работ [71,123,133, 142] отмечена трудность определения As и Pb из-за наложения PbLα (10.55 кэВ) и AsKα (10.53 кэВ) линий. Это наложение можно частично учесть с помощью измерения пиков AsKβ (11.72 кэВ) и PbLβ (12.61 кэВ), однако в присутствии пиков других элементов, например BrKα (11.91 кэВ), эта проблема усложняется [71].…”
Section: матричные эффекты и спектральные наложенияunclassified