2017
DOI: 10.1016/j.jmsy.2016.11.002
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Evaluation of a metrology platform for an articulated arm coordinate measuring machine verification under the ASME B89.4.22-2004 and VDI 2617_9-2009 standards

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Cited by 11 publications
(5 citation statements)
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“…However, the probe is only suitable for calibration. Recently, Acero and Brau-Avila et al [19][20][21][22] designed an indexed metrology platform, which adjusts the direction of the AACMM through the rotation of the platform. This reduces the time for placing and adjusting the position of the calibration artifact, and thus improves the calibration efficiency.…”
Section: Introductionmentioning
confidence: 99%
“…However, the probe is only suitable for calibration. Recently, Acero and Brau-Avila et al [19][20][21][22] designed an indexed metrology platform, which adjusts the direction of the AACMM through the rotation of the platform. This reduces the time for placing and adjusting the position of the calibration artifact, and thus improves the calibration efficiency.…”
Section: Introductionmentioning
confidence: 99%
“…This could improve the measurement accuracy and save calibration time, in comparison with 1D or 2D artifacts. Acero et al [13][14][15][16] designed an index metering platform with the AACMM fixed. The AACMM calibration is achieved by rotating the platform, which greatly simplifies the calibration process.…”
Section: Introductionmentioning
confidence: 99%
“…The calibration accuracy is not high enough. Acero [26][27][28] proposed a method to obtain the virtual distance by adjusting the direction of the AACMM. Instead of rotating the gauge around the AACMM, multiple standard lengths of different lengths and positions were obtained in multiple quadrants.…”
Section: Introductionmentioning
confidence: 99%