Abstract:Fourier Ptychography Microscopy (FPM) is considered as one emerging technology for the development of high efficiency and low-cost microscopic scanners. One of the major advantages of FPM is its large depth of field (DOF), which significantly reduces the mechanical accuracy requirement of the scanning stages. In this study, we experimentally measured the DOF for our FPM prototype under different illumination conditions. The measurements were based on the theory that the DOF is considered as the range along opt… Show more
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