Evaluating surface roughness of curved surface with circular profile based on arithmetic circular arc fitting

Abstract

A procedure based on Kåsa fit for evaluating the surface roughness of a curved surface with a circular arc profile was suggested in this paper. To investigate the effectiveness of the method, some curved surface profiles with preset surface roughness were numerically generated, and their surface roughness was evaluated by the procedure based on Kåsa fit. And the surface roughness of two experimental surface profiles evaluated by the method based on Kåsa fit was compared with those evaluated by linear fitting and quadratic polynomial fitting to demonstrate both the effectiveness and the preservation of Kåsa fit-based procedure. Results show that the evaluated value of surface roughness by Kåsa fit-based procedure only deviated from the actual value by less than 10%, even in the case of considerable fitting parameters’ error (>30%). Also, the Kåsa fit can report a reasonable value of surface roughness with better preservation of shift and rotation motion of the surface profile compared to both linear fit and quadratic polynomial fitting, especially for the curved surface with a short radius. This procedure based on Kåsa fit can be used in evaluating surface roughness of curved surface with circular arc profile no matter what pose of the object under observed.

A Study of 2D Roughness Periodical Profiles on a Flat Surface Generated by Milling with a Ball Nose End Mill

“…The most common method to achieve this sampling is the use of contact profilometers [ 2 , 3 , 4 , 5 , 6 , 7 , 8 , 9 , 10 ] as a reliable but time-consuming method. Some other methods use the non-contact surface exploration by lasers [ 11 ], laser interferometry [ 12 , 13 ], laser confocal microscopes [ 14 ], optical systems [ 15 , 16 , 17 , 18 ], machine vision systems [ 19 ], or are inspired by research into the optical properties of surfaces (ability to split white light, diffractive properties) using scanning electron microscopy and atomic force microscopy [ 20 ].…”