Chalcogenides are attractive materials for microelectronics
applications
due to their ability to change physical, optical, and electrical properties
under applied electric stimulus. One of the most recent interest in
chalcogenides is their use to enable the development of a two-terminal
selector device, which is a fast, volatile, resistance switching device.
The electrical signature of Ovonic threshold switching (OTS) chalcogenide
materials is well suited for such applications. While there are numerous
known OTS materials, most of them contain toxic elements. There is
hence a need to find environment-friendly OTS materials. For this
to happen, we strive to predict electrical device parameters only
from atomistic first-principles simulations of the chalcogenide materials,
as this can be a faster and less expensive route to screen the performances
of chalcogenide candidates. By mapping the experimentally measured
set of electrical OTS materials into atomistic models and computing
their electronic properties, we were able to identify correlations
between computed properties such as the theoretical trap/mobility
gaps, the local atomic coordination environments of the elements adopted
in the material, and the experimentally measured first-fire/threshold/hold
voltages, hold/leakage currents, or extracted trap density. These
findings can guide in identifying OTS materials with predefined electronic
properties, tailored to the requirements of specific microelectronics
applications with only first-principles simulations.