“…STXM can measure both light elements and the L-edge of transition metals (Figure 1; Hoffman, 2018;Hoffman et al, 2018;Brandes, et al, 2010). XRD detects repeating patterns of atoms in well-crystalline materials, creating a diffractogram output that is compared to a database to identify the compounds that make up a sample under the X-ray beam (Figure 2; Dinnebier and Billinge, 2008;Dunlap, 2018;Callefo et al, 2019;von der Heyden, 2020).…”