2014
DOI: 10.1017/s1431927614001627
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Evaluating Angular Ion Current Density for Atomically Defined Nanotips

Abstract: In this paper we investigate methods to characterize angular current density from atomically defined gas field ion sources. We show that the ion beam emitted from a single apex atom is described by a two-dimensional Gaussian profile. Owing to the Gaussian shape of the beam and the requirement to collect the majority of the ion current, fixed apertures have inhomogeneous illumination. Therefore, angular current density measurements through a fixed aperture record averaged angular current density. This makes com… Show more

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Cited by 7 publications
(5 citation statements)
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“…The electron beam spot size of the 14 × 14 CNT emitters can be analyzed with the help of the FEM image. The symmetrically distributed electron beam spot is well described by the Gaussian distribution 7 , 50 , , Where , and represents the peak intensity, mean (maximum peak intensity), and standard deviation of the distribution respectively. In the electron beam spot profile, the width of the intermediate of the maximum intensity value represents the FWHM which is expressed as .…”
Section: Resultsmentioning
confidence: 99%
“…The electron beam spot size of the 14 × 14 CNT emitters can be analyzed with the help of the FEM image. The symmetrically distributed electron beam spot is well described by the Gaussian distribution 7 , 50 , , Where , and represents the peak intensity, mean (maximum peak intensity), and standard deviation of the distribution respectively. In the electron beam spot profile, the width of the intermediate of the maximum intensity value represents the FWHM which is expressed as .…”
Section: Resultsmentioning
confidence: 99%
“…The pattern of the high-dense bright spot has a circular spot, and the intensity profile of the beam spot can be well described by a Gaussian distribution, , where , , and represent the peak intensity, the maximum point of peak intensity and the standard deviation, respectively. The fullwidth half maximum of the electron beam can be expressed as FWHM = , where σ is the standard deviation [ 21 , 51 ]. Figure 6 explains the analysis of the intensity profile of the high-dense electron beam spot of Figure 4 .…”
Section: Resultsmentioning
confidence: 99%
“…The electron beam pattern was observed by optical microscope and was measured with an image analysis tool to obtain the correct beam size. Beam size values of 55 μm and 114 μm were obtained from the full width at half maximum (FWHM) value at the bright spot using Gaussian four-peak parameter fitting [ 33 ]. As a result of emission patterns, the solid angles of 1560- and 550-CNT emitters were 0.053 and 0.2 sr, respectively, at an emission current of 1 μA.…”
Section: Resultsmentioning
confidence: 99%