2022
DOI: 10.1111/ijag.16563
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Etching behavior of ground fused silica and light enhancement modulated by surface/subsurface cracks

Abstract: The mechanical defects (scratches/cracks) originated from grinding processing need to be dislodged so that improving the optical performance of fused silica. In this paper, HF‐based (HF represents hydrofluoride acid) etchant was used as a subsequent fabrication for loose‐abrasive ground fused silica, and the surface morphology and characteristics of samples were evaluated, meanwhile, the electric/light field distribution around treated cracks was simulated using the finite difference time domain (FDTD) method.… Show more

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Cited by 9 publications
(5 citation statements)
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“…The density ρ was assumed as 2.2 g/cm 3 in the present study for both the Si thermal oxide layer and the silica glass 25,26 …”
Section: Methodsmentioning
confidence: 99%
See 1 more Smart Citation
“…The density ρ was assumed as 2.2 g/cm 3 in the present study for both the Si thermal oxide layer and the silica glass 25,26 …”
Section: Methodsmentioning
confidence: 99%
“…The density 𝜌 was assumed as 2.2 g/cm 3 in the present study for both the Si thermal oxide layer and the silica glass. 25,26 XPS was used also for evaluating surface silanol density. Quantification of the surface silanol density is generally difficult, and several methods with a secondary-ion mass spectrometer, 27,28 a high-resolution elastic recoil detection analysis, 29 and an XPS 24,28,30 have been proposed so far.…”
Section: Sample Evaluationmentioning
confidence: 99%
“…A numerical simulation of the electric/light field distribution near the substrates was carried out using an analysis software based on the FDTD algorithm [6] . The FDTD method is based on an iterative solution to Maxwell's equations, and the distribution of both the electric field and the magnetic field within the space can be solved gradually and alternately [7,8] . The components of Maxwell's equation are unfolded in the right-angle coordinate system along x, y and z direction by the following formula [9] :…”
Section: Theoretical Modelmentioning
confidence: 99%
“…Fracture defects such as subsurface cracks caused by grinding are the manufacturing defects that are most likely to cause laser irradiation damage and must be completely removed in the subsequent polishing process so that the fused silica optics can withstand the irradiation of high-power lasers [1][2][3][4][5][6]. The polishing process is expensive, however, and requires a long process cycle.…”
Section: Introductionmentioning
confidence: 99%