2015 China Semiconductor Technology International Conference 2015
DOI: 10.1109/cstic.2015.7153456
|View full text |Cite
|
Sign up to set email alerts
|

Etch rate prediction in plasma etching using feed forward Error-Back Propagation neural network model

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...

Citation Types

0
0
0

Publication Types

Select...

Relationship

0
0

Authors

Journals

citations
Cited by 0 publications
references
References 4 publications
0
0
0
Order By: Relevance

No citations

Set email alert for when this publication receives citations?