Estimation of Stress in Polycrystalline CuInSe2 Films Deposited on Mo-Coated Glass Substrates

Abstract

This paper provides a background to the Higher Education System in Australia and in particular to the provision of undergraduate professional engineering degree programmes, often from the perspective of an accrediting body. The current issues impacting on the operating environment, as well as educational design and quality assurance approaches are discussed. Some of the key features and emerging innovations within the Australian engineering education system are reviewed. Copyright © 2007 Curtin University of Technology and John Wiley & Sons, Ltd.

Comprehensive Comparison of Various Techniques for the Analysis of Elemental Distributions in Thin Films

“…The corresponding analysis techniques, i.e., Raman spectroscopy, grazing-incidence X-ray diffraction (GI-XRD), and electron backscatter diffraction (EBSD), may be influenced by strain present in the Cu(In,Ga)Se 2 layers investigated. Macrostress values for these layers of ten to eighty 10 4 N/m 2 are reported (Chakrabarti et al, 1996, 1997; Witte et al, 2009 a , 2009 b ). Assuming a Young's modulus for CuInSe 2 of about 6.49 × 10 10 N/m 2 (Fernández & Wasim, 1990), the corresponding macrostrain can be calculated to about 10 −5 .…”

Growth and characterization of AgIn5S8 and CuIn5S8 thin films

“…The surface of Mo/Ti-coated glass was investigated before the deposition process and after deposition of spinel layer and its mechanical removal by an adhesive tape. The phase composition of the samples was studied by X-ray diffraction (XRD) analysis using Table 1 Coefficients of linear thermal expansion (α) of spinel structures and substrates [4,5].…”