Establishing Traceability to the International System of Units for Scattering Parameter Measurements From 750 GHz to 1.1 THz

Ridler, N M; Clarke, Roland

doi:10.1109/tthz.2015.2502068

Cited by 24 publications

(18 citation statements)

References 25 publications

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“…An alternative solution to this problem is to apply a TRL calibration technique and accept a reduction in the useful bandwidth of the 'line' standard [27]. Successful TRL calibration between 750 GHz and 1.1 THz has been demonstrated using this approach [28]. Other approaches based on measuring multiple lines combined with statistical methods have also been successfully used [29,30].…”

Section: Calibrationmentioning

confidence: 99%

“…During the past decade, considerable progress has been made toward establishing traceability for VNA measurements above 100 GHz, for example [37][38][39]. Recently, these activities have extended to cover VNA metrology up to 1.1 THz [28,40]. The uncertainty in the electrical properties (scattering parameters) of the reference standards is typically determined from dimensional measurements on a section of precision waveguide, and then computing the electrical behavior through electro-magnetic simulations.…”

Section: Verification and Traceabilitymentioning

confidence: 99%

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Metrology State-of-the-Art and Challenges in Broadband Phase-Sensitive Terahertz Measurements

et al. 2017

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The two main modalities for making broadband phase-sensitive measurements at terahertz frequencies are Vector Network Analyzers (VNA) and Time Domain Spectrometers (TDS). These measuring instruments have separate and fundamentally different operating principles and methodologies, and they serve very different application spaces. The different architectures give rise to different measurement challenges and metrological solutions. This article reviews these two measurement techniques and discusses the different issues involved in making measurements using these systems. Calibration, verification and measurement traceability issues are reviewed, along with other major challenges facing these instrument architectures in the years to come. The differences in, and similarities between, the two measurement methods are discussed and analysed. Finally, the operating principles of ElectroOptic Sampling (EOS) are briefly discussed. This technique has some similarities to TDS and shares application space with the VNA.

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Section: Calibrationmentioning

confidence: 99%

Section: Verification and Traceabilitymentioning

confidence: 99%

Metrology State-of-the-Art and Challenges in Broadband Phase-Sensitive Terahertz Measurements

et al. 2017

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“…Furthermore, it is possible, using this microfabrication method to form microstructures where the shape and spacing cannot be realized using conventional milling techniques and the electrical effects of these more complex shapes are investigated herein. The frequency range chosen for the study was simply driven by equipment availability in terms of the intended follow-up measurements and the difficulty in conventional milling and repeatable flange alignment of the measurement test fixtures, which becomes problematic for the 750 1100 GHz band [6].…”

Section: A Initial Designmentioning

confidence: 99%

Low-cost method for waveguide device components fabrication at 220 – 325 GHz

Doychinov

Steenson

Abadi

et al. 2016

2016 IEEE International Conference on Microwave and Millimeter Wave Technology (ICMMT)

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Abstract-This work explores a rapid design and manufacturing approach to realize complex 3D pillar type filter and transmission line structures for applications in the 220 − 325 GHz range and which cannot be economically reproduced by conventional machining processes or present rapid prototyping methods. The significance of this investigation is that at submillimetre-wave or THz frequencies, where the waveguide features are less than 100µm and the skin depths are less than 200nm, the exact conductor shape and surface roughness have a significant electrical effect and any variations result in an important disagreement between the modelled and measured characteristics. This is a proof of concept validation of the rapid manufacturing approach and is aimed at paving the way to a range of THz passive waveguide components, where the availability and cost of such components is typically prohibitive and where the surface roughness is minimized and highly reproducible. Using this approach the fabrication times can be as rapid as a few days and can yield many hundreds of highly reproducible millimetre scale components.

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“…Two precision waveguide lines, with a difference in thickness of a quarter-wavelength, are then required. LRL calibrations are unsuitable for precision waveguide measurements above 110 GHz, as all four S-parameters of the first Line standard must be known [5]. Other solutions include the use of a pair of 3λ/4 length standards, each designed for one half of the waveguide band of interest [3].…”

Section: Introductionmentioning

confidence: 99%

“…For waveguide S-parameter measurements, traceability is established through the dimensional accuracy and precision of all waveguide components and is directly limited by their mechanical tolerances. Attempts to establish traceability above 100 GHz have been made in recent years [6], [5], based on the use of custom/high-precision waveguide flanges. Mechanical tolerances in waveguide components also create uncertainty in S-parameter measurements, due to misalignment between waveguides.…”

Section: Introductionmentioning

confidence: 99%