2012 IEEE International Reliability Physics Symposium (IRPS) 2012
DOI: 10.1109/irps.2012.6241893
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ESD protection structure with inductor-triggered SCR for RF applications in 65-nm CMOS process

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Cited by 4 publications
(2 citation statements)
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“…In this scenario, the design of circuits allowing to protect the mm-wave circuits and systems against ESDs while reducing their impact in the mm-wave design is a subject of major interest in the RF community. Several solutions have been studied in recent years [4]- [8]. Baluns have been cited [4], which allows relatively natural isolation, or the use of compensation circuits based either on an inductance or on a transmission line [5]- [8].…”
Section: Introductionmentioning
confidence: 99%
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“…In this scenario, the design of circuits allowing to protect the mm-wave circuits and systems against ESDs while reducing their impact in the mm-wave design is a subject of major interest in the RF community. Several solutions have been studied in recent years [4]- [8]. Baluns have been cited [4], which allows relatively natural isolation, or the use of compensation circuits based either on an inductance or on a transmission line [5]- [8].…”
Section: Introductionmentioning
confidence: 99%
“…Several solutions have been studied in recent years [4]- [8]. Baluns have been cited [4], which allows relatively natural isolation, or the use of compensation circuits based either on an inductance or on a transmission line [5]- [8]. However, in all cases, the solutions proposed turn out to be narrow band, which obliges the designers to design protection for each considered frequency band.…”
Section: Introductionmentioning
confidence: 99%