Escape probability of Auger electrons from noncrystalline solids: Exact solution in the transport approximation

Tilinin, I.S.

doi:10.1103/physrevb.46.13739

Cited by 110 publications

(32 citation statements)

References 18 publications

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“…As a result the yield y is mainly determined by diffusely scattered electrons and is almost independent of the X-ray angle of incidence, y (λiλtr/3/a)1/2 in accordance with the recent finding [7].…”

Section: Theorysupporting

confidence: 76%

“…It should be emphasized that formula (2) is found in the transport approximation implying replacement of a real differential elastic scattering cross-section in the kinetic equation by an isotropic one being equal to the corresponding momentum transfer cross-section. The validity of the transport approximation is discussed in detail elsewhere [3,7].…”

Section: Theorymentioning

confidence: 99%

“…In the case of non-polarized radiation and randomly oriented atoms and molecules, the initial spectrum of photoelectrons normalized to unity is given by the expression [6]: (1) where Ω0 and ay are the unit vectors along the directions of photoelectron emission from atoms and X-ray propagation respectively, and is the asymmetry parameter. To find the angular distribution of photoelectrons leaving the sample it is necessary to solve a kinetic equation with a boundary conditions implying that no electrons enter the target [3,7]. Recently Werner and Tilinin [3] found an expression for the angular distribution of photoelectrons escaping from the target in the case of azimuthally symmetrical problem.…”

Section: Theorymentioning

confidence: 99%

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Signal Photoelectron Yield Dependence on the X-Ray Angle of Incidence

1994

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The photoelectron emission from solids irradiated by X-rays was described by the analytical theory of electron transport and simulated by the Monte Carlo technique. The medium energy electron transport problem is treated by means of a Boltzmann type kinetic equation satisfying appropriate boundary conditions. The solution of the transport equation was obtained in the transport approximation based on the generalized radiative field similarity principle. Simple and reliable formalism was derived for both the differential and the total photoelectron yields. The dependence of the photoelectron yield on the X-ray incidence angłe and the "flattening" effect of multiple ełastic scattering on the angular distribution of electrons leaving the target are analysed in detail. The photoelectron yields and angular distributions calculated by the Monte Carlo algorithm, based on a realistic differential elastic scattering cross-section, are in good agreement with the results found from analytical theory. It is shown that main characteristics of the photoełectron emission are determined primarily by two parameters: the inelastic and the transport mean free paths.

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Section: Theorysupporting

confidence: 76%

Section: Theorymentioning

confidence: 99%

Section: Theorymentioning

confidence: 99%

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Signal Photoelectron Yield Dependence on the X-Ray Angle of Incidence

1994

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“…Meanwhile numerous studies indicate that the ignoring of elastic scattering may cause serious errors in quantitative interpretation of the experimental data [2][3][4][5][6][7]. Elastic collisions have been found to affect noticeably the medium energy electron transport in solids and to lead to an overall decrease in the effective escape depth by several tens of percent with respect to the value predicted by Eq.…”

Section: (845)mentioning

confidence: 99%

“…In this report the mean escape depth of photoelectrons leaving the target is calculated analytically by solving a classical kinetic equation in the transport approximation [6,7] and by applying the Monte Carlo simulation method [8] based on a realistic elastic scattering cross-section [9].…”

Section: (845)mentioning

confidence: 99%

Mean Escape Depth of Signal Photoelectrons from Amorphous and Polycrystalline Solids

1994

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• Escape depth of photoelectrons leaving a target without being scattered inelastically was submitted to extensive theoretical analysis. Dependence of the mean escape depth on the X-ray angle of incidence and the electron initial angular distribution inside the sample was considered. The Monte Carlo algorithm was developed basing on a differential elastic scattering cross--section calculated within the partial-wave expansion method and a realistic electron-atom mteraction potential. The mean escape depth was evaluated by means of the depth distribution function found analytically by solving a kinetic equation and by the Monte Carlo technique. The agreement between the results obtained from two methods is excellent. Elastic scattering was found to reduce considerably the escape depth. This reduction may reach up to 25% in the case of heavy elements in the practical X-ray photoelectron spectroscopy analysis. It was shown that the mean escape depth expressed in units of the electron transport mean free path is a universal function of the ratio of the inelastic to the transport mean free paths, the asymmetry parameter and the X-ray angle of incidence. A simple explicit expression for this function is proposed.

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Quantitative AES IV: Accuracy of the Numerical Evaluation of Peak Areas in AES using the Universal Tongaard Background Subtraction Method

Seah

1996

Surf. Interface Anal.

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Escape probability of Auger electrons from noncrystalline solids: Exact solution in the transport approximation

Cited by 110 publications

References 18 publications

Signal Photoelectron Yield Dependence on the X-Ray Angle of Incidence

Signal Photoelectron Yield Dependence on the X-Ray Angle of Incidence

Mean Escape Depth of Signal Photoelectrons from Amorphous and Polycrystalline Solids

Quantitative AES IV: Accuracy of the Numerical Evaluation of Peak Areas in AES using the Universal Tongaard Background Subtraction Method

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