ESCA studies of some copper and silver selenides

Romand, M.; Roubin, M.; Deloume, J.P.

doi:10.1016/0368-2048(78)85029-4

Cited by 185 publications

(78 citation statements)

References 45 publications

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“…6(a) and 6(b). Comparing the spectra of Cu and S for the composite BTDA-ODA/CuS 35 where the same value was found for CuS. The x-ray diffraction pattern of CuS/Kapton composite film, obtained from the optimized conditions described before, shows a diffraction pattern that can be indexed as CuS.…”

Section: B Surface Characterization Of Composites Filmssupporting

confidence: 71%

Low-resistance films of polyimides with impregnated copper sulfide

et al. 2001

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Surface modification of polyimides has been used to obtain better interaction with an inorganic material. Copper sulfide incorporation onto the surface of commercial Kapton polyimide showed that treatment with base was necessary for adherence of the copper sulfide to the polymeric matrix. The optimized conditions for composite preparation, obtained by response surface methodology, was pH 1.4 at 80°C for 3.67 h. Using these conditions, we obtained electrical resistance as low as 1.0 ohm for CuS\Kapton composites. These optimized conditions were used to prepare other low-resistance polyimide composites. The resulting composites were analyzed by photoelectron spectroscopy. The presence of S(2p) and Cu(2p) peaks demonstrated the incorporation of copper sulfide onto the polyimide surface. Scanning electron microphotographs and the images from atomic force microscopy showed a homogeneous CuS distribution in all composites.

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Section: B Surface Characterization Of Composites Filmssupporting

confidence: 71%

Low-resistance films of polyimides with impregnated copper sulfide

et al. 2001

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“…The spectra consist of two isolated peaks at about 367.8 and 373.8 eV which correspond to the intense spin-orbit doublet of Ag 3d (Ag 3d 5/2 and Ag 3d 3/2 ) from Ag 2 Se with spin-orbit splitting of 6.0 eV. [17] Two weaker satellite peaks arising owing to the nonmonochromatic nature of the X-ray source are also seen and are marked by arrows in Fig. 4.…”

Section: Xps Measurementsmentioning

confidence: 94%

Characterization of silver selenide thin films grown on Cr‐covered Si substrates

Mohanty

Malar

Osipowicz

et al. 2008

Surface & Interface Analysis

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Thermal stability of silver selenide thin films formed from the solid-state reaction of Ag-Se diffusion couples on Si substrates covered with a thin Cr film, is investigated. Glancing angle X-ray diffraction (GXRD), XPS, atomic force microscopy (AFM) and Rutherford backscattering spectrometry (RBS) are used to characterize the as-deposited films and those annealed at 100, 200, 300, and 400• C. The results reveal the formation of polycrystalline orthorhombic silver selenide films that remain stable without compositional change upon thermal annealing, in marked contrast to the agglomeration exhibited by silver selenide films deposited on Si without Cr film. The improvement in the thermal stability is attributed to compressive stress relief by a grainy morphology with large surface area, the formation of which is promoted by partially oxidized Cr adhesion film.

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“…We are not conscious of any previous XPS studies for KAgF 3 and KAgF 4 , although AgF and AgF 2 , have been the subject of previous work. [4,5] …”

Section: Introductionmentioning

confidence: 99%

“…[3] Nanostructured substrates for SERS are expected to be anisotropic in terms of the local surface plasmon resonances, [4] which imply that the enhancement factor should extrinsically depend on the incident polarization. This effect is expected to be particularly strong for nanometric gaps between nanoparticles, [5] which have been implicated as the most likely sites for single-molecule SERS. [6,7] However, most SERS studies have been performed at fixed polarization configuration and/or using macroscopic sampling volumes, for which a detailed comparison between local morphology, SERS activity and theory is difficult.…”

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confidence: 99%