2007
DOI: 10.1117/12.685237
|View full text |Cite
|
Sign up to set email alerts
|

Error rate improvement of super-RENS random signal with the minimum mark length of 75nm in 405nm 0.85 NA system

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1

Citation Types

0
2
0

Year Published

2007
2007
2008
2008

Publication Types

Select...
1
1

Relationship

1
1

Authors

Journals

citations
Cited by 2 publications
(2 citation statements)
references
References 0 publications
0
2
0
Order By: Relevance
“…4-2b) is for the GeN y study here, and more precise control is actually necessary for the practical use as is previously discussed in ref. 9. Figure 5 shows the combined waveform observed as a function of readout cycles when there are no GeN y interface layers.…”
Section: Super-resolution Readout Durability Of 97-nm (2t) and 340-nmmentioning
confidence: 97%
“…4-2b) is for the GeN y study here, and more precise control is actually necessary for the practical use as is previously discussed in ref. 9. Figure 5 shows the combined waveform observed as a function of readout cycles when there are no GeN y interface layers.…”
Section: Super-resolution Readout Durability Of 97-nm (2t) and 340-nmmentioning
confidence: 97%
“…By combining a 3 cm diameter disc and a micro pickup with Blu-ray optics data capacities in the order of 1 GB have already been demonstrated (Van der Aa et al 2003). Capacities in the order of 5 GB may be achieved in the near future by using near-field optics (Davies et al 2007) or discs with a non-linear layer structure that is called super-resolution near-field structure (Bae et al 2007). There are two popular approaches to reduce the size of optical drives.…”
Section: Introductionmentioning
confidence: 96%