2002
DOI: 10.1016/s0927-0248(02)00046-6
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Error diagnosis and optimisation of c-Si solar cell processing using contact resistances determined with the Corescanner

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Cited by 28 publications
(15 citation statements)
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“…Comparing series‐resistance maps obtained from Corescan 1 with r s –PL images, gives information about a lateral inhomogeneous rear contact: the Corescan technique measures with a scratching contact pin all series‐resistance contributions from the front side (finger, contact, and emitter), but not the contribution from the rear side. The r s –PL technique measures all series‐resistance contributions including the rear side.…”
Section: Discussionmentioning
confidence: 99%
See 1 more Smart Citation
“…Comparing series‐resistance maps obtained from Corescan 1 with r s –PL images, gives information about a lateral inhomogeneous rear contact: the Corescan technique measures with a scratching contact pin all series‐resistance contributions from the front side (finger, contact, and emitter), but not the contribution from the rear side. The r s –PL technique measures all series‐resistance contributions including the rear side.…”
Section: Discussionmentioning
confidence: 99%
“…Methods to quantify such variations measure at least partly the series resistance and assume that they mainly originate from contact‐resistance variations. These methods include Corescan 1, Cello 2, and techniques based on photoluminescence (PL) 3, 4, dark and illuminated lock‐in thermography 5, 6, or electroluminescence 7, 8. The traditional method to determine solely the contact resistance is the transmission line method (TLM) introduced by Berger 9 and extended by Reeves et al 10.…”
Section: Introductionmentioning
confidence: 99%
“…Characterization of the NPN structures as formed have been carried out measuring their sheet resistance and through Suns-V oc [8] before and after metallization. Additionally Current-Voltage in the solar simulator, spectral response and contact resistance by CORESCAN [9] have been obtained for representative samples from each batch. The mass spectra were recorded on a Time of Flight Secondary Ion Mass Spectrometry TOF-SIMS IV instrument from Ion-Tof GmbH.…”
Section: Methodsmentioning
confidence: 99%
“…We note that previous contributions have described the study of series resistances with a spatial resolution using noncamera-based techniques 14,15 and camera-based techniques. [16][17][18][19] However, those methods provide maps of an R S parameter, which is an aggregate of all the series resistances existing in the solar cell.…”
Section: Introductionmentioning
confidence: 99%