“…Optical metrology possesses the advantages of being a non-contact method and having high resolution and efficiency for workpiece contour measurement and surface quality inspection. Several methods exist for measuring optical topography, including the stereoscopic method, structured light, laser triangulation, conoscopic holography, the moiré method, and heterodyne interferometry [1,2,3,4,5,6,7,8,9,10,11,12,13].…”