Erratum: Electrical conductivity and thin film growth dynamics [Phys. Rev. B61, 11 109 (2000)]

Thin film thickness measurement by the conductivity theory in the framework of Born approximation

“…Consider a thin film of two rough surfaces with thickness d, which its thickness is smaller than the mean free path of the electron. The thin film crosses the z-axis at d/2 and −d/2, with z 1 ( r) = d/2 + h 1 ( r) and z 2 ( r) = −d/2 + h 2 ( r), where h 1 and h 2 are the random roughness fluctuations of surface 1 and 2 respectively with h( r) = 0 Palasantzas et al (2000). Note that the choice of the quantum mechanical formulation in this limitation is due to the fact that the thickness layer is smaller than the mean free path of the electron.…”

“…Note that the choice of the quantum mechanical formulation in this limitation is due to the fact that the thickness layer is smaller than the mean free path of the electron. In this case the electrons would scatter from the surface before being scattered by the bulk electrons Palasantzas et al (1997Palasantzas et al ( , 2000. The conductivity relation for the case where the surface roughness ω is considered much smaller than the film thickness d (ω ≪ d)) is Palasantzas et al (2000)…”

“…where N is the number of occupied mini-bands, E F is the Fermi energy, D is the scattering matrix which contains two terms: incoherent term D in , (incoherent scattering by two rough interfaces) and cross-correlation term D cor , (coherent scattering by two interfaces). The elements of D in and D cor describe intra-and inter-subband transitions, which is expressed by Palasantzas et al (2000) […”

“…In a sense that the local fractal dimensions would also affect the characteristics of the self-affine fractal model (e.g. electric conductivity) for one rough layer Palasantzas et al (1997) or two rough layers Palasantzas et al (2000). Here we take an inverse approach based on the two layer self-affine fractal model of Palasantzas Palasantzas et al (2000), where we measure the electric conductivity in order to obtain details on the thickness of the layer.…”

“…electric conductivity) for one rough layer Palasantzas et al (1997) or two rough layers Palasantzas et al (2000). Here we take an inverse approach based on the two layer self-affine fractal model of Palasantzas Palasantzas et al (2000), where we measure the electric conductivity in order to obtain details on the thickness of the layer. In this article we implement a model to determine the thickness of metallic films with two rough boundaries that is based on their conductivity in the framework of Born approximation.…”