Epitaxial Lead Selenide Layers over a Wide Range of Their Thickness on Dielectric Substrates

Abstract

The article deals with the relative deformation in monocrystalline lead selenide layers grown on dielectric substrates KCl, BaF 2 and NaCl. It was established that the deformation in the layers was associated with the mismatch between the lattice constants of the layer and the substrate. The tangential lattice constants in relation to the deformation were studied depending on the layers thickness, and their correlation was shown. It is noted that, as the layers thickness decreases, it becomes possible to observe maximum relative deformations on all substrates.