Epitaxial growth of YBa2Cu3O7-δon Ni89V11non-magnetic biaxially textured substrate using NiO as buffer layer

Boffa, V.; Petrișor, T.; Celentano, G.; Fabbri, F.; Annino, C.; Ceresara, S.; Ciontea, L.; Galluzzi, V.; Gambardella, U.; Grimaldi, Gaia; Mancini, A.

doi:10.1088/0953-2048/13/10/311

Cited by 15 publications

(2 citation statements)

References 13 publications

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“…The (001)[110] textured NiO layer was obtained in-situ by oxidation of Ni-V substrate at 750°C in 20 mTorr pure oxygen atmosphere for 10 minutes [10]. Ceria films were grown on the Y 2 0 3 /Ni-V structure at 600°C in a 50 mTorr oxygen background pressure.…”

Section: Ybco On Y 2 0 ] 3 -Based Heterostructuresmentioning

confidence: 99%

DEVELOPMENT OF BUFFER LAYER STRUCTURES FOR YBa₂Cu₃O_7-δ COATED CONDUCTORS ON TEXTURED Ni-V SUBSTRATE

Mancini

Boffa

Celentano

et al. 2000

Int. J. Mod. Phys. B

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Y2O3 and MgO-based buffer layer architectures on non-magnetic cube textured Ni-V substrates were studied for YBa2Cu30 7 -8 (YBCO) coated conductors fabrication using both pulsed laser deposition and electron beam evaporation. The Y2O3 films exhibited a biaxial texture with cp and co-scans full width at half maximum (FWHM) of about 11° and 7° and a smooth and continuous surface. YBCO thick films deposited on Ce02/Y203/Ni-V and Ce02/Y203/NiO/Ni-V architectures were mainly c-axis oriented showing a TC(R=O) above 85 K. MgO films were grown by electron beam evaporation both directly on metallic substrates and with a Pd intermediate layer. The MgO films grown on Ni-V substrates show a good texture and good surface morphological properties. The MgO deposition on Pd buffered Ni-V substrate leads to films with better structural properties with respect to MgO depositon on bare Ni-V substrate, showing cp and co-scans FWHM up to 8° and 5°, respectively. In spite of the interdiffusion between Pd buffer layer and Ni-V substrate, the MgO films preserve their structural and morphological properties when annealed at typical YBCO deposition temperature.

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Section: Ybco On Y 2 0 ] 3 -Based Heterostructuresmentioning

confidence: 99%

DEVELOPMENT OF BUFFER LAYER STRUCTURES FOR YBa₂Cu₃O_7-δ COATED CONDUCTORS ON TEXTURED Ni-V SUBSTRATE

Mancini

Boffa

Celentano

et al. 2000

Int. J. Mod. Phys. B

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“…(1976) reported that it was impossible to produce repeatably a sample with only one or the other of these. A narrow temperature interval in which the (001) oxide orientation is preferentially selected has been reported in studies on textured Ni (Ginsbach et al ., 1991; Matsumoto et al ., 1999, 2000, 2003; Boffa et al ., 2000; Celentano et al ., 2000; Lockman et al ., 2001, 2003; Kursumovic et al ., 2003), but these studies have concentrated on producing cube textured NiO layers for superconducting applications. As a consequence, relatively few results with textured Ni substrates show the oxide microstructure and examine oxide orientations other than the cube texture.…”

Section: Introductionmentioning

confidence: 99%

Crystal orientation mapping of NiO grown on cube textured Ni tapes

Woodcock

Abell

Eickemeyer

et al. 2004

Journal of Microscopy

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SummarySamples of cube textured Ni tapes were oxidized in flowing oxygen at different temperatures. Crystal orientation maps (COMs) of the resulting oxide layers were produced by electron backscatter diffraction. The oxide layers were also analysed by X-ray diffraction (XRD), scanning electron microscopy and atomic force microscopy (AFM). The oxide grain size of a sample oxidized at 600 ° C was similar to that of the substrate and the oxide was highly textured, both indicating epitaxial growth. The orientation relationship between the substrate and the oxide was directly observed from XRD to be (111) NiO //(001) Ni , [ ! 01] NiO //[110] Ni with four, equivalent, in-plane variants. In each variant, the oxide has both <110>-and <211>-type directions parallel to the Ni <110> directions. Differences in oxide thickness and surface roughness on neighbouring grains were revealed by AFM and these were attributed to the existence of a range of oxide growth conditions resulting from small differences in the orientation of each substrate grain. Similar macrotexture and microstructure were observed on a sample oxidized at 1300 ° C, but additional, facetted oxide crystals had formed at the oxide grain boundaries. COMs showed that these crystals were either cube or 45 ° rotated cube orientated, a texture different to that of the large oxide grains. The grain boundary crystals were thought to form by inward diffusion of oxygen at defects in the growing oxide scale.

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Nickel base substrate tapes for coated superconductor applications

2007

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Epitaxial growth of YBa₂Cu₃O_7-δon Ni₈₉V₁₁non-magnetic biaxially textured substrate using NiO as buffer layer

Cited by 15 publications

References 13 publications

DEVELOPMENT OF BUFFER LAYER STRUCTURES FOR YBa₂Cu₃O_7-δ COATED CONDUCTORS ON TEXTURED Ni-V SUBSTRATE

DEVELOPMENT OF BUFFER LAYER STRUCTURES FOR YBa₂Cu₃O_7-δ COATED CONDUCTORS ON TEXTURED Ni-V SUBSTRATE

Crystal orientation mapping of NiO grown on cube textured Ni tapes

Nickel base substrate tapes for coated superconductor applications

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Epitaxial growth of YBa2Cu3O7-δon Ni89V11non-magnetic biaxially textured substrate using NiO as buffer layer

Cited by 15 publications

References 13 publications

DEVELOPMENT OF BUFFER LAYER STRUCTURES FOR YBa2Cu3O7-δ COATED CONDUCTORS ON TEXTURED Ni-V SUBSTRATE

DEVELOPMENT OF BUFFER LAYER STRUCTURES FOR YBa2Cu3O7-δ COATED CONDUCTORS ON TEXTURED Ni-V SUBSTRATE

Crystal orientation mapping of NiO grown on cube textured Ni tapes

Nickel base substrate tapes for coated superconductor applications

Contact Info

Product

Resources

About

Epitaxial growth of YBa₂Cu₃O_7-δon Ni₈₉V₁₁non-magnetic biaxially textured substrate using NiO as buffer layer

DEVELOPMENT OF BUFFER LAYER STRUCTURES FOR YBa₂Cu₃O_7-δ COATED CONDUCTORS ON TEXTURED Ni-V SUBSTRATE

DEVELOPMENT OF BUFFER LAYER STRUCTURES FOR YBa₂Cu₃O_7-δ COATED CONDUCTORS ON TEXTURED Ni-V SUBSTRATE