2020
DOI: 10.1021/acs.cgd.9b01112
|View full text |Cite
|
Sign up to set email alerts
|

Epitaxial Growth and Structural Characterization of Ceria Deposited by Atomic Layer Deposition on High-Surface Porous Yttria-Stabilized Zirconia Thin Films

Abstract: Yttria-stabilized zirconia (YSZ) is a well-known solid electrolyte material in high-temperature applications that involve the conduction of oxygen ions. One possible way of enhancing the performance of devices like solid oxide fuel cells at lower operation temperatures is the design of the electrolyte’s surface by increasing the surface area and modifying the surface properties by ceria coating to improve the oxygen incorporation reaction. However, the preparation of a conformal coating while maintaining a com… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1
1
1

Citation Types

1
20
0

Year Published

2020
2020
2023
2023

Publication Types

Select...
7

Relationship

4
3

Authors

Journals

citations
Cited by 13 publications
(21 citation statements)
references
References 41 publications
1
20
0
Order By: Relevance
“…This is expected as ALD is well known as deposition technique, which allows the deposition of uniformal and homogeneous coatings with a precise control of the layer thickness even in case of porous thin films. [ 66–68 ] After cycling, the coated NCM thin film (Figure 6d) shows no significant difference compared to the pristine sample, while for the uncoated thin film (Figure 6c), changes of the surface morphology are clearly visible. Cracks formed at the surface and it appears as if the particles on the surface became porous.…”
Section: Resultsmentioning
confidence: 99%
See 1 more Smart Citation
“…This is expected as ALD is well known as deposition technique, which allows the deposition of uniformal and homogeneous coatings with a precise control of the layer thickness even in case of porous thin films. [ 66–68 ] After cycling, the coated NCM thin film (Figure 6d) shows no significant difference compared to the pristine sample, while for the uncoated thin film (Figure 6c), changes of the surface morphology are clearly visible. Cracks formed at the surface and it appears as if the particles on the surface became porous.…”
Section: Resultsmentioning
confidence: 99%
“…To investigate the influence of an ultrathin surface coating with varying thickness on the electrochemical performance, NCM samples were coated with a thin Al 2 O 3 film using atomic layer deposition (ALD), which enables a homogeneous coating even of porous samples. [66,67,88] The ALD deposition was carried out in a PicoSun R200 ALD reactor using trimethylaluminium (TMA, STREM chemicals inc., min. 98%) as precursor and deionized water as reactant for TMA to form the oxide layer.…”
Section: Methodsmentioning
confidence: 99%
“…As shown recently, ceria grows epitaxially on ZrO 2 -based oxides with a grain size of a few nanometers when using ALD. 20 Thus, it is reasonable to assume that the coating layers exhibits a high grain boundary density, which can significantly affect the defect concentrations due to the formation of a space charge region at the boundary. As for ceria the formation of a space charge layer results in an accumulation of electrons and a depletion of oxygen vacancies at the grain boundary, 58−60 a high grain boundary density may be responsible for the high Ce 3+ concentration in the coating layer.…”
Section: ■ Results and Discussionmentioning
confidence: 99%
“…In order to cover the pore surfaces with the desired thickness, the layer growth using atomic layer deposition (ALD) has gained considerable scientific interest. Due to its operation mode, including the separation of the gas–solid reactions with an inert gas purging step, the deposition of the desired metal oxide species is performed layer-by-layer. Hence, the ALD technique offers the possibility to coat even complex substrates such as porous and mesoporous thin films with atomic-level control of the formed layer and its thickness with significant reproducibility. Thus, the ALD method classifies as superior in comparison with wet-chemical approaches such as wet impregnation, co-condensation, and grafting as well as physical attempts such as physical vapor or pulsed layer deposition.…”
Section: Introductionmentioning
confidence: 99%
“…Zscherp et al also examined the nanostructure of an ALD oxide coating, namely, 9-20 nm ceria deposited onto porous YSZ thin films. 312 TEM investigations revealed epitaxial growth of ceria with a columnar structure and excellent conformality (Fig. 29).…”
Section: Surface Modificationmentioning
confidence: 99%