2007
DOI: 10.1016/j.ssc.2007.04.023
|View full text |Cite
|
Sign up to set email alerts
|

Epitaxial graphene

Help me understand this report
View preprint versions

Search citation statements

Order By: Relevance

Paper Sections

Select...
1

Citation Types

25
590
3
4

Year Published

2008
2008
2015
2015

Publication Types

Select...
5
5

Relationship

0
10

Authors

Journals

citations
Cited by 838 publications
(622 citation statements)
references
References 38 publications
25
590
3
4
Order By: Relevance
“…[9], where, by deploying a continuum approximation, the small angle limit was investigated and v F found to be suppressed. Experimentally, the evidence for this seems uncertain as a suppression of v F is found for graphene stacks grown on both the C and Si faces of SiC, whereas twist boundary faults appear only during growth on the C face [17]. This disagreement between the continuum approximation for the (singular) !…”
Section: 056803 (2008) P H Y S I C a L R E V I E W L E T T E R Smentioning
confidence: 98%
“…[9], where, by deploying a continuum approximation, the small angle limit was investigated and v F found to be suppressed. Experimentally, the evidence for this seems uncertain as a suppression of v F is found for graphene stacks grown on both the C and Si faces of SiC, whereas twist boundary faults appear only during growth on the C face [17]. This disagreement between the continuum approximation for the (singular) !…”
Section: 056803 (2008) P H Y S I C a L R E V I E W L E T T E R Smentioning
confidence: 98%
“…We observe cooling of the photogenerated carrier distribution as well as electronhole recombination in graphene in real time. Our results indicate that the recombination times in graphene depend on the carrier density and material disorder.The epitaxial graphene samples used in this work were grown on the carbon face of semi-insulating 6H-SiC wafers using techniques that have been reported previously [12]. As discussed in [8,11], X-ray photoemission, Raman, and optical/IR/THz transmission spectroscopy were used to characterize each sample to determine the number of carbon atom layers and the carrier momentum relaxation time.…”
mentioning
confidence: 99%
“…Advances in the epitaxial growth of graphene films on SiC have the potential to open new classes of device applications that may revolutionize the semiconductor road map for future decades [1][2][3][4][5][6][7][8][9]. However, this progress will require an in-depth understanding and utilization of the electronic processes that take place at the nanoscale, in particular, the role of the interface buffer layer, where most of the electronic properties of the system can be controlled [10].…”
mentioning
confidence: 99%