2015
DOI: 10.1063/1.4935125
|View full text |Cite
|
Sign up to set email alerts
|

Environmental stability of high-mobility indium-oxide based transparent electrodes

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
3
1

Citation Types

2
37
0

Year Published

2016
2016
2024
2024

Publication Types

Select...
5
1

Relationship

1
5

Authors

Journals

citations
Cited by 48 publications
(39 citation statements)
references
References 32 publications
2
37
0
Order By: Relevance
“…Accelerated life time tests are commonly used to evaluate and estimate the degradation behavior. Damp heat tests have already shown that the electrical properties of conventional TCOs are subject to degradation .…”
Section: Resultsmentioning
confidence: 99%
See 1 more Smart Citation
“…Accelerated life time tests are commonly used to evaluate and estimate the degradation behavior. Damp heat tests have already shown that the electrical properties of conventional TCOs are subject to degradation .…”
Section: Resultsmentioning
confidence: 99%
“…They reveal interstitial or substitutional hydrogen on an oxygen site as shallow donor. Additionally, hydrogen incorporated at grain boundaries is considered as passivation of defects to reduce the transport barrier [7,14,[18][19][20].…”
mentioning
confidence: 99%
“…Damp heat tests performed under standard conditions of 85% humidity at 85°C for prolonged time (1000 h) were used to demonstrate the high environmental stability of ITO and IZO electrodes. [183] IO:H and AZO, on the contrary, showed poorer electrical stability under damp heat conditions mainly due to the introduction of water at grain boundaries. [183,184] In the case of IO:H it has been recently demonstrated that damp heat degradation is strongly linked to the hydrogen content in the films.…”
Section: Stability Under Thermal and Humid Environmentsmentioning
confidence: 99%
“…[183] IO:H and AZO, on the contrary, showed poorer electrical stability under damp heat conditions mainly due to the introduction of water at grain boundaries. [183,184] In the case of IO:H it has been recently demonstrated that damp heat degradation is strongly linked to the hydrogen content in the films. IO:H films with hydrogen content lower than 5 at.% exhibit stable electrical properties after exposure to DH conditions.…”
Section: Stability Under Thermal and Humid Environmentsmentioning
confidence: 99%
See 1 more Smart Citation