2009
DOI: 10.1016/j.neucom.2009.02.013
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Ensemble of online sequential extreme learning machine

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Cited by 305 publications
(132 citation statements)
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“…From the last chapter we can know,the accuracy of OS-ELM algorithm is related to the initial setting of parameters, and different parameters have different effects on the accuracy of OS-ELM classifier [10] [11]. The parameters of artificial setting are not high, so the parameters are optimized by genetic algorithm.…”
Section: The Transformer Fault Diagnosis Based On Os-elm and Genetic mentioning
confidence: 99%
See 1 more Smart Citation
“…From the last chapter we can know,the accuracy of OS-ELM algorithm is related to the initial setting of parameters, and different parameters have different effects on the accuracy of OS-ELM classifier [10] [11]. The parameters of artificial setting are not high, so the parameters are optimized by genetic algorithm.…”
Section: The Transformer Fault Diagnosis Based On Os-elm and Genetic mentioning
confidence: 99%
“…But in the implementation of the GA-oselm algorithm, these parameters do not need manual settings. Because the genetic algorithm simulates natural selection and natural genetic processes in replication, crossover and mutation process, a set of candidate solutions is retained in each iteration [13] [14]. The genetic operators (selection, crossover and mutation) are used to generate a new generation of candidate solutions.…”
Section: The Selection Of Os-elm and Genetic Algorithm Algorithm Paramentioning
confidence: 99%
“…The learning algorithm of ELM not only combines these activation functions within the hidden processing units, but also enhances the state-of-the-art approaches by speeding up the learning process of the algorithms and by avoiding local minima, which is one of the major drawbacks of gradient-based learning algorithms [15]. Several extensions to ELM have been introduced [20], [6], [26].…”
Section: Applied Procedures and Algorithmsmentioning
confidence: 99%
“…The invention of high-speed CCD cameras also enables fast image acquisition. In the 1980s, some organizations [3] A number of improved ELM-based algorithms have been developed, such as: I-ELM (incremental ELM) [20], OS-ELM (on-line sequential ELM) [21], EI-ELM (enhanced incremental ELM) [22], OP-ELM (Optimally Pruned ELM) [23], EM-ELM (esrror minimized ELM) [24], EOS-ELM (ensemble OS-ELM) [25], and so on. In the field of defect identification, ELM also plays a significant role.…”
Section: Introductionmentioning
confidence: 99%