Enhancing thickness determination of nanoscale dielectric films in phase diffraction-based optical characterization systems with radial basis function neural networks
Abstract:Accurate determination of the optical properties of ultra-thin dielectric films is an essential and challenging task in optical fiber sensor systems. However, nanoscale thickness identification of these films may be laborious due to insufficient and protracted classical curve matching algorithms. Therefore, this experimental study presents an application of a radial basis function (RBF) neural network in phase diffraction-based optical characterization systems to determine the thickness of nanoscale polymer fi… Show more
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