2022
DOI: 10.1016/j.cej.2021.134223
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Enhancing the performance of perovskite solar cells through simple bilateral active site molecule assisted surface defect passivation

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Cited by 24 publications
(17 citation statements)
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“…The trap‐filled limit voltage ( V TFL ) represents the bias voltage as the defects in the perovskite films completely were filled. [ 57 ] We can easily observe that the AOMCl‐treated film has a smaller V TFL of 0.35 V than the 0.76 V of the pristine film. According to the formula, the N t value of film with AOMCl was reduced to 4.918 × 10 15 from 1.068 × 10 16 cm −3 of the pristine film, which further supports the conclusion that addition of AOMCl in FAPbI 3 can reduce the defects of perovskite film.…”
Section: Resultsmentioning
confidence: 99%
“…The trap‐filled limit voltage ( V TFL ) represents the bias voltage as the defects in the perovskite films completely were filled. [ 57 ] We can easily observe that the AOMCl‐treated film has a smaller V TFL of 0.35 V than the 0.76 V of the pristine film. According to the formula, the N t value of film with AOMCl was reduced to 4.918 × 10 15 from 1.068 × 10 16 cm −3 of the pristine film, which further supports the conclusion that addition of AOMCl in FAPbI 3 can reduce the defects of perovskite film.…”
Section: Resultsmentioning
confidence: 99%
“…The decay lifetimes of TRPL measurements are fitted according to the biexponential decay function Y = A 1 e −t/τ1 + A 2 e −t/τ2 + Y 0 , where A 1 and A 2 are the decay amplitudes, τ 1 and τ 2 are the fast decay and slow decay components, and Y 0 is a constant for the baseline offset. 32 All TRPL data are summarized in Table 2. The average decay times (τ avg ) were extracted to be 14.01 and 28.96 ns for SFX-DM-DPA-and SFX-DM-based samples, respectively, which is consistent with the steady-state PL results.…”
Section: Resultsmentioning
confidence: 99%
“…Moreover, SFX-DM-DPA exhibits a higher quenching efficiency over 95%, indicating a better hole extraction ability than SFX-DM due to the higher hole mobility. The decay lifetimes of TRPL measurements are fitted according to the biexponential decay function Y = A 1 e – t /τ1 + A 2 e – t /τ2 + Y 0 , where A 1 and A 2 are the decay amplitudes, τ 1 and τ 2 are the fast decay and slow decay components, and Y 0 is a constant for the baseline offset . All TRPL data are summarized in Table .…”
Section: Resultsmentioning
confidence: 99%
“…The preparation of PSC devices is based on our previous reports . For the devices prepared by acridine-based HTMs, the optimal concentration was 40 mg/mL in chlorobenzene.…”
Section: Methodsmentioning
confidence: 99%
“…According to the development history of PSC, the rapid increase of PCE is closely related to the engineering of composition and crystallization behavior of the perovskite absorber layer, the development of new hole/electron transport materials (HTMs/ETMs), , and the modification of the charge transport interface. , Moreover, the previous research proved that HTMs have a pivotal position in ensuring efficient charge carrier transport through extracting photogenerated holes from the perovskite absorbing layer and block photogenerated electrons. Besides that, HTMs can also act as a protective layer for the perovskite layer, stopping the perovskite from being degraded by water vapor, oxygen, and so forth.…”
Section: Introductionmentioning
confidence: 99%