2021
DOI: 10.3390/photonics8020048
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Enhancing Multi-Distance Phase Retrieval via Unequal Interval Measurements

Abstract: In the conventional methods of multi-distance phase retrieval, the diffraction intensity patterns are recorded at equal intervals, which can induce slow convergence or stagnation in the subsequent reconstruction process. To solve this problem, a measurement method with unequal intervals is proposed in this paper. The interval spacings between adjacent measurement planes are decreased gradually. A large gap accelerates retrieval progress, and a short span helps to recover detailed information. The proposed appr… Show more

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Cited by 8 publications
(2 citation statements)
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“…One strategy is to scan the detector axially along the optical axis and record the diffraction patterns over different locations. Through iterative diffraction calculations between the object plane and a series of measurement planes, the complex wavefront of the object can be retrieved without prior knowledge [8][9][10][11][12]. Ptychography imaging with spatially confined illumination is another strategy that captures hundreds of diffraction intensities by laterally moving the object with a localized probe beam at several grid positions [13,14].…”
Section: Introductionmentioning
confidence: 99%
“…One strategy is to scan the detector axially along the optical axis and record the diffraction patterns over different locations. Through iterative diffraction calculations between the object plane and a series of measurement planes, the complex wavefront of the object can be retrieved without prior knowledge [8][9][10][11][12]. Ptychography imaging with spatially confined illumination is another strategy that captures hundreds of diffraction intensities by laterally moving the object with a localized probe beam at several grid positions [13,14].…”
Section: Introductionmentioning
confidence: 99%
“…To overcome this constraint, we introduce two enhancements to the SBMIR technique. The initial enhancement entails a reimagined approach to measurement [12]. Conventionally, diffraction intensities of samples are gathered at equidistant diffraction distances.…”
Section: Introductionmentioning
confidence: 99%