Abstract:Abstract. Reliability and robustness have been always important parameters of integrated systems. However, with the emergence of nanotechnologies reliability concerns are arising with an alarming pace. The consequence is an increasing demand of techniques that improve yield as well as lifetime reliability of today's complex integrated systems. It is requested though, that the solutions result in only minimum penalties on power dissipation and system performance. The approach Alternating Module Activation (AMA)… Show more
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