1999
DOI: 10.1016/s0038-1098(99)00279-3
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Enhancement of proximity effects due to random roughness at a superconductor/metal interface

Abstract: We consider the enhancement of proximity effects due to random roughness at a superconductor/normal-metal interface. The roughness is described by the rms roughness amplitude D, the correlation length j , and the roughness exponent H0 Յ H Յ 1: Small roughness exponents H ( Ͻ 0.5) are shown to influence strongly the relative reduction of the superconductor critical temperature DT c =T c : Moreover, the effect of the roughness exponent H on DT c =T c appears to be more pronounced than that of the long wavelength… Show more

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Cited by 4 publications
(5 citation statements)
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References 17 publications
(29 reference statements)
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“…This hypothesis may be supported by theoretical and experimental studies in other groups [8][9][10]. Proximity effects depend on the penetration of electrons from the normal metal into the superconducting films.…”
Section: Possible Causesmentioning
confidence: 60%
“…This hypothesis may be supported by theoretical and experimental studies in other groups [8][9][10]. Proximity effects depend on the penetration of electrons from the normal metal into the superconducting films.…”
Section: Possible Causesmentioning
confidence: 60%
“…From the study of relevant artificial structures of heterogeneous constituents, [1][2][3][4][5][6][7][8][9][10][11][12] it is well known that any effect occurring by the interface of layered hybrids has only limited range, thus penetrating at a length scale ranging between a few nanometers to a few tens of nanometers at the interior of each constituent layer. Following this guideline, for the FM/PE/FM hybrids studied here, the FM outer layers should have the lowest possible thickness since this will ensure that the part of the Co layers affected from the strain provided by the PE crystal will be the maximum.…”
Section: Resultsmentioning
confidence: 99%
“…As a consequence, a reduction of the SC critical temperature is observed that is noticeable only when the SC layer is quite thin, since it is inversely proportional to the square of its thickness. [10][11][12] Finally, an interesting class of hybrids that is intensively studied recently is the one composed of FM films adjacent to a piezoelectric (PE) substrate. [13][14][15][16][17][18][19] These hybrids have attracted the interest of researchers, since except for basic science they are promising for numerous devices and sensors, as for instance in magnetic recording for information storage.…”
Section: Introductionmentioning
confidence: 99%
“…[8±10,18]. Therefore, in general, the thickness dependence of the local surface slope will be dierent for dierent growth modes, which will result in dierent morphology contributions on proximity pinning eects [7,16].…”
Section: Resultsmentioning
confidence: 99%
“…www.elsevier.nl/locate/physc roughness exponents (which quantify ®ne roughness details at short wavelengths) H (<0.5) can strongly in¯uence DT c =T c besides the long wavelength roughness ratio D=n with D the rms roughness amplitude and n the lateral correlation length [7]. A rough self-ane growth front arises due to competition between noise induced roughening and surface relaxation of incoming adatoms (stable growth) [8±10].…”
Section: Introductionmentioning
confidence: 99%