2022
DOI: 10.1016/j.jallcom.2022.167000
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Enhancement of nonlinear optical parameters upon phase transition in new quaternary Ge20Ag10Te10Se60 films by annealing at various temperatures for optoelectronic applications

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Cited by 15 publications
(4 citation statements)
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“…The high-frequency dielectric constant (ε ∞ ) was calculated from the following formula for all the investigated samples using the values of the linear static refractive index (n o ) [93]:…”
Section: Volume and Surface Energy Loss Functionsmentioning
confidence: 99%
“…The high-frequency dielectric constant (ε ∞ ) was calculated from the following formula for all the investigated samples using the values of the linear static refractive index (n o ) [93]:…”
Section: Volume and Surface Energy Loss Functionsmentioning
confidence: 99%
“…Based on the XRD pattern, the average crystallite size ( D ) calculated from the full-width half maxima (FWHM) observed prominent peaks using Scherer's equation: 45 where ‘ λ ’ is the Cu K α -line wavelength (1.54 Å), θ is the incidence angle, and β is the FWHM that infers the structural broadening. The δ (dislocation density), ε (lattice strain), and the number of crystallites per unit surface area ( N c ) were evaluated using the following equations: 46 where t has a value of ∼800 nm (film thickness). The evaluated structural parameters for the different films are presented in Table 1 .…”
Section: Resultsmentioning
confidence: 99%
“…where 'l' is the Cu K a -line wavelength (1.54 Å), q is the incidence angle, and b is the FWHM that infers the structural broadening. The d (dislocation density), 3 (lattice strain), and the number of crystallites per unit surface area (N c ) were evaluated using the following equations: 46 Lattice strain ð3Þ ¼ b cot q 4 ;…”
Section: Structural Study By Xrd and Raman Spectroscopymentioning
confidence: 99%
“…Then, the surface analysis was performed at a voltage of 200 kV (Akhtar et al 2016 ). Simultaneously, selected area electron diffraction (SAED) analysis was carried out on the TEM device to evaluate crystallinity of the sample by using an ImageJ software tool to determine the d-spacing referred to the theta and hkl integers, as reported by Barua et al ( 2019 ) and Das et al ( 2022 ). Furthermore, to verify the elemental composition of CuO NPs, scanning electron microscopy (FEI-SEM, Inspect S50, Netherlands) was conducted at a 15–30 kV voltage equipped with an energy dispersive X-ray spectrophotometer (EDX).…”
Section: Methodsmentioning
confidence: 99%