1990
DOI: 10.1109/22.46433
|View full text |Cite
|
Sign up to set email alerts
|

Enhanced through-reflect-line characterization of two-port measuring systems using free-space capacitance calculation

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1
1
1

Citation Types

0
4
0

Year Published

1992
1992
2017
2017

Publication Types

Select...
5
2

Relationship

0
7

Authors

Journals

citations
Cited by 21 publications
(4 citation statements)
references
References 8 publications
0
4
0
Order By: Relevance
“…Figure 11 shows the simulated and measured characteristic impedance of the line. The measured impedance has been obtained using the following equations [6]:…”
Section: Inverted Line On Siliconmentioning
confidence: 99%
“…Figure 11 shows the simulated and measured characteristic impedance of the line. The measured impedance has been obtained using the following equations [6]:…”
Section: Inverted Line On Siliconmentioning
confidence: 99%
“…Since the propagation constant y is obtained from above, we can solve for the effective dielectric constant [5] -72c2…”
Section: Theorymentioning
confidence: 99%
“…The authors of [7] showed that the series inductance of the via can be as significant as its shunt capacitance at higher frequencies, and also for vias with a small drill-hole diameter. In another study [8], the authors successfully used measurements to derive a -equivalent circuit model for a via, but noted that this model was only accurate at operating frequencies up to about 2 GHz.…”
Section: Introductionmentioning
confidence: 99%