Enhanced Sol–Gel Route to Obtain a Highly Transparent and Conductive Aluminum-Doped Zinc Oxide Thin Film

Nateq, Mohammad Hossein; Ceccato, Riccardo

doi:10.3390/ma12111744

Cited by 27 publications

(12 citation statements)

References 116 publications

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“…When the Al dopant concentration was increased to 5 at%, films exhibited an intense (002) preferential orientation with sharper defined diffraction peaks indicating an increase in the crystallinity. The dominance of the (002) peak, as well as the enhancement of the c-axis orientation with the Al concentration increasing was also observed in previous reports [15,24]. By comparing diffraction peaks of Al-doped samples in all of the four diffractogramms, we find that the diffraction peaks decrease significantly with 7 at%, Al concentration, which confirms a large amount of Al dopants produce lattice disorder in crystalline [14,20].…”

Section: Resultssupporting

confidence: 86%

“…Techniques addressed to study doped ZnO effects on the properties of AZO films including electrospray method [9], pulsed laser deposition (PLD) [10], RF magnetron sputtering technique [11], atomic layer deposition [12], chemical bath deposition (CBD) [13], sol-gel process [14,15], etc. have been used to deposit AZO nanoparticles.…”

Section: Introductionmentioning

confidence: 99%

“…However, the sol-gel method is widely used, since it provides a low-cost equipment for a film with high surface uniformity and packing density. So far, it is interesting to note that the sol-gel process is the most favored chemical technique for samples to achieve best properties [14,15].…”

Section: Introductionmentioning

confidence: 99%

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X-ray Diffraction, XPS, and Raman Spectroscopy of Coated ZnO:Al (1—7 at%) Nanoparticles

Konan

Hartiti

Batan

et al. 2019

e-J. Surf. Sci. Nanotechnol.

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Group III elements doping for zinc oxide is currently attracting much attention for the study of absorber layer in nano-optoelectronic and photovoltaic devices as an alternative route to indium tin oxide (ITO) due to their optimized properties. In this report, Al-doped ZnO (AZO, Al: 1−7 at%) nanoparticles have been successfully deposited onto glass substrates using sol-gel process, and investigated by techniques such as X-ray diffraction (XRD), Raman spectroscopy, X-ray photoelectron spectroscopy (XPS), and scanning electron microscopy (SEM). The coated ZnO:Al nanoparticles at Al concentration up to 5 at% showed a nanosized polycrystalline structure with a c-plane preferred orientation. In AZO (7 at%), lower diffraction peaks were observed. The crystallite size calculated from XRD was ranged 38.7−43.5 nm. SEM showed spherical nanoparticles in shape with a smooth surface. The Raman results provided peaks located at 434, 435, 559, 851, and 1090 cm −1. According to XPS, the as-grown nanoparticles present the most intense peak located at about 1021.8 eV, assigned to the Zn 2p 3/2 corresponding to zinc oxide. It was concluded that the structural properties of AZO thin films were improved with Al (5 at%), and these samples may be considered as an alternative of costly ITO in thin-film photovoltaic applications.

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Section: Resultssupporting

confidence: 86%

Section: Introductionmentioning

confidence: 99%

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X-ray Diffraction, XPS, and Raman Spectroscopy of Coated ZnO:Al (1—7 at%) Nanoparticles

Konan

Hartiti

Batan

et al. 2019

e-J. Surf. Sci. Nanotechnol.

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“…The chemical synthesis of ZnO nanopowder started with the dissolution of 0.2 mol of zinc acetate dihydrate (Zn(CH 3 COO) 2 •2H 2 O, Sigma Aldrich, Saint Louis, MO, USA) in 200 mL of pure ethanol at room temperature for 10 min under magnetic stirring [51]. The solubilization was promoted using mono-ethanolamine (C 2 H 7 NO, Merck) in 1:1 zincamine molar ratio, while the precipitation was obtained by adding de-ionized water (2:1 water-zinc molar ratio) under stirring.…”

Section: Methodsmentioning

confidence: 99%

Thin Films of Plasma-Polymerized n-Hexane and ZnO Nanoparticles Co-Deposited via Atmospheric Pressure Plasma Jet

et al. 2021

Self Cite

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This study explores the co-deposition of thin polymeric films loaded with nanoparticles for its possible future application as radiation detectors. Thin films containing zinc oxide (ZnO) nanoparticles in plasma polymerized n-hexane (PPH) were deposited on silicon substrates using an atmospheric pressure plasma jet (APPJ). Crystalline ZnO nanoparticles were produced by wet chemistry, characterized, and injected through the plasma with an aerosol buffer. The precursor hydrocarbon was polymerized in atmosphere at room temperature by the plasma, resulting in a highly crosslinked structure chemically stable against common solvents. The polymer structure was characterized by FT-IR, NMR, and thermal analyses. Photoluminescence analysis revealed that ZnO UV excitonic emission is recovered owing to the passivation through polymeric encapsulation, with a remarkable increase in luminescence yield.

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“…Specially, transparent conductive materials attract much attention due to their wide range of applications such as touch screens [1], displays [2], electromagnetic shielding [3], RF/microwave [4], glass heaters [5], solar cells [6], flexible electronics [7], OLED [8] and so on. In both science and engineering, sheet resistance R s is widely used to characterize a nanofilm's electrical conductivity, and it is usually measured using the four-point probe method [9][10][11][12]. In this method, one major drawback is that good contact should be formed between the probes and the sample under test.…”

Section: Introductionmentioning

confidence: 99%

Contactless Measurement of Sheet Resistance of Nanomaterial Using Waveguide Reflection Method

Tariq

Zhao

et al. 2020

Materials

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Conductive nanomaterials are widely studied and used. The four-point probe method has been widely used to measure nanomaterials’ sheet resistance, denoted as Rs. However, for materials sensitive to contamination or physical damage, contactless measurement is highly recommended if not required. Feasibility of Rs evaluation using a one-port rectangular waveguide working on the microwave band in a contact-free mode is studied. Compared with existed waveguide methods, the proposed method has three advantages: first, by introducing an air gap between the waveguide flange and the sample surface, it is truly contactless; second, within the specified range of Rs, the substrate’s effect may be neglected; third, it does not require a matched load and/or metallization at the sample backside. Both theoretical derivation and simulation showed that the magnitude of the reflection coefficient S11 decreased monotonously with increasing Rs. Through calibration, a quantitative correlation of S11 and Rs was established. Experimental results with various conductive glasses showed that, for Rs in the range of ~10 to 400 Ohm/sq, the estimation error of sheet resistance was below ~20%. The potential effects of air gap size, sample size/location and measurement uncertainty of S11 are discussed. The proposed method is particularly suitable for characterization of conductive glass or related nanomaterials with Rs in the range of tens or hundreds of Ohm/sq.

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Enhanced Sol–Gel Route to Obtain a Highly Transparent and Conductive Aluminum-Doped Zinc Oxide Thin Film

Cited by 27 publications

References 116 publications

X-ray Diffraction, XPS, and Raman Spectroscopy of Coated ZnO:Al (1—7 at%) Nanoparticles

X-ray Diffraction, XPS, and Raman Spectroscopy of Coated ZnO:Al (1—7 at%) Nanoparticles

Thin Films of Plasma-Polymerized n-Hexane and ZnO Nanoparticles Co-Deposited via Atmospheric Pressure Plasma Jet

Contactless Measurement of Sheet Resistance of Nanomaterial Using Waveguide Reflection Method

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