2009 15th IEEE International on-Line Testing Symposium 2009
DOI: 10.1109/iolts.2009.5195986
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Enhanced self-configurability and yield in multicore grids

Abstract: ISBN 978-1-4244-4596-7International audienceAs we move deeper in the nanotechnology era, computer architecture is solicited to manipulate tremendous numbers of devices per chip with high defect densities. These trends provide new computing opportunities but efficiently exploiting them will require a shift towards novel, highly parallel architectures. Fault tolerant mechanisms will have to be integrated to the design to deal with the low yield of future nanofabrication processes. In this paper we consider multi… Show more

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Cited by 3 publications
(1 citation statement)
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“…It should be noted that our proposed strategy is different with the solution [8] that proposed a mechanism for discovering the faultless paths between an I/O port and the faultfree cores in a MP2SoC. This centralized discovering process is piloted by the smart I/O port, that is a critical resource.…”
Section: Related Workmentioning
confidence: 99%
“…It should be noted that our proposed strategy is different with the solution [8] that proposed a mechanism for discovering the faultless paths between an I/O port and the faultfree cores in a MP2SoC. This centralized discovering process is piloted by the smart I/O port, that is a critical resource.…”
Section: Related Workmentioning
confidence: 99%