Optifab 2017 2017
DOI: 10.1117/12.2279821
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Enhanced resolution and accuracy of freeform metrology through Subaperture Stitching Interferometry

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Cited by 4 publications
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“…The single measurements are deliberately taken with overlapping areas to conduct the fine registration, which in optical surface metrology is known as sub-aperture stitching. 1 Most usual is the combination of an areal-topography measuring instrument, like a disc scanning confocal microscope or a coherence scanning interferometer, and a translational positioning system, [1][2][3][4][5][6] but also combinations with a rotatory positioning system, 7-9 a positioning system with more than three degrees of freedom [10][11][12][13][14] or a one-dimensional point distance sensor 15 have been shown. [16][17][18][19] Various algorithms are applied to conduct the fine registration or stitching with the correction of positioning errors in a variable number of degrees of freedom.…”
Section: Introduction and Literature Reviewmentioning
confidence: 99%
“…The single measurements are deliberately taken with overlapping areas to conduct the fine registration, which in optical surface metrology is known as sub-aperture stitching. 1 Most usual is the combination of an areal-topography measuring instrument, like a disc scanning confocal microscope or a coherence scanning interferometer, and a translational positioning system, [1][2][3][4][5][6] but also combinations with a rotatory positioning system, 7-9 a positioning system with more than three degrees of freedom [10][11][12][13][14] or a one-dimensional point distance sensor 15 have been shown. [16][17][18][19] Various algorithms are applied to conduct the fine registration or stitching with the correction of positioning errors in a variable number of degrees of freedom.…”
Section: Introduction and Literature Reviewmentioning
confidence: 99%
“…Another stitching interferometry method with a spherical reference wavefront is presented in Ref. 6 measuring a specimen with 100 mm in diameter and up to 1300 μm of freeform departure from the best-fit sphere. Reference 7 presents an approach with a combination of subaperture stitching and white-light interferometry.…”
Section: Introductionmentioning
confidence: 99%