2018
DOI: 10.1002/admi.201801432
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Enhanced Oxygen Evolution Reaction Activity of Nanoporous SnO2/Fe2O3/IrO2 Thin Film Composite Electrodes with Ultralow Noble Metal Loading

Abstract: A conductive SnO2 layer and small quantities of IrO2 surface cocatalyst enhance the catalytic efficiency of nanoporous Fe2O3 electrodes in the oxygen evolution reaction at neutral pH. Anodic alumina templates are therefore coated with thin layers of SnO2, Fe2O3, and IrO2 by atomic layer deposition. In the first step, the Fe2O3 electrode is modified with a conductive SnO2 layer and submitted to different postdeposition thermal treatments in order to maximize its catalytic performance. The combination of steady‐… Show more

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Cited by 22 publications
(23 citation statements)
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“…300 mV), from ca . 1.00 V RHE to 0.70 V RHE ; this shift is similar to the ones obtained with co‐catalysts made of noble materials, such as IrO 2 …”
Section: Resultssupporting
confidence: 81%
“…300 mV), from ca . 1.00 V RHE to 0.70 V RHE ; this shift is similar to the ones obtained with co‐catalysts made of noble materials, such as IrO 2 …”
Section: Resultssupporting
confidence: 81%
“…As both SFCNF/Co 1− x S and SFCNF/Co 1− x S@CoN show crystalline features according to TEM results, X‐ray diffraction (XRD) analysis was conducted to further study crystallographic structures, which are thought to be crucial for functional performance. [ 19 ] In blue plot of Figure a, diffraction peaks at 2θ = 30.5°, 35.2°, 46.8°, 54.3°, 62.3°, 66.2°, 72.9°, and 74.4° are readily indexed to characteristic (100), (101), (102), (110), (103), (201), (004), and (202) planes of face‐centered cubic Co 1− x S (PDF No. 42–0826), respectively.…”
Section: Resultsmentioning
confidence: 99%
“…6 reveals that crystalline SnO 2 is obtained from ALD without annealing necessary, as has been reported before for layers of sufficient thickness and depending on deposition temperature and substrate. 57,58 Therefore, the amount of hydrated material (presumably amorphous) is low in the bulk. The very broad signal stretching from 20 to 40 and evident of a large amount of amorphous material can be attributed to the alumina matrix, since it is absent of data recorded for planar lms on silicon wafers in grazing incidence (0.6 ).…”
Section: Resultsmentioning
confidence: 99%