2021
DOI: 10.1111/ijac.13742
|View full text |Cite
|
Sign up to set email alerts
|

Enhanced mechanical and thermal properties of AlN ceramics via a chemical precipitation process

Abstract: Aluminum nitride (AlN) ceramics are promising materials for the thermal management of high power electronics, photovoltaic moduli, and LEDs, because of their high thermal conductivity (the intrinsic thermal conductivity ≈319 W m −1 K −1 ), high electrical resistivity, low dielectric constant, no toxicity, and a coefficient of thermal expansion close to that of silicon. [1][2][3] Up until now, substantial research efforts have been made to enhance the thermal conductivity of AlN ceramic. [4][5][6] The high powe… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
3
1
1

Citation Types

0
12
0

Year Published

2021
2021
2023
2023

Publication Types

Select...
8

Relationship

0
8

Authors

Journals

citations
Cited by 18 publications
(12 citation statements)
references
References 57 publications
0
12
0
Order By: Relevance
“…The experimental results of thermal conductivity, thermal diffusivity, and specific heat capacity are presented in Figure 7. The thermal diffusivity of ThO 2 ceramic was determined using an LFA, and the thermal conductivity was calculated by the following equation: λbadbreak=ραCp$$\begin{equation}\lambda = \rho \alpha {C_p}\end{equation}$$where λ is the thermal conductivity, α is the thermal diffusivity, C p is the specific heat capacity, and ρ is the ceramic density 36 . The specific heat capacity of ThO 2 ceramic was determined by using the sapphire method from the TG‐DSC measurement, and its density was determined by the Archimedes method.…”
Section: Resultsmentioning
confidence: 99%
See 1 more Smart Citation
“…The experimental results of thermal conductivity, thermal diffusivity, and specific heat capacity are presented in Figure 7. The thermal diffusivity of ThO 2 ceramic was determined using an LFA, and the thermal conductivity was calculated by the following equation: λbadbreak=ραCp$$\begin{equation}\lambda = \rho \alpha {C_p}\end{equation}$$where λ is the thermal conductivity, α is the thermal diffusivity, C p is the specific heat capacity, and ρ is the ceramic density 36 . The specific heat capacity of ThO 2 ceramic was determined by using the sapphire method from the TG‐DSC measurement, and its density was determined by the Archimedes method.…”
Section: Resultsmentioning
confidence: 99%
“…where λ is the thermal conductivity, α is the thermal diffusivity, C p is the specific heat capacity, and ρ is the ceramic density. 36 The specific heat capacity of ThO 2 ceramic was determined by using the sapphire method from the TG-DSC measurement, and its density was determined by the Archimedes method. Such value of thermal diffusivity corresponds to the relative density of ThO 2 between 95.0% and 99.0%, which was proved by Malakkal.…”
Section: Tho 2 Ceramicmentioning
confidence: 99%
“…Aluminum nitride (AlN) ceramic has good comprehensive properties such as reliable insulation, low dielectric loss, good mechanical properties, and thermal conductivity. Therefore, this material is regarded as a new generation of high‐performance ceramic material and is widely used as substrate materials for high‐power electronic devices 1–3 . But AlN ceramic needs metallization to form a conductive metal layer.…”
Section: Introductionmentioning
confidence: 99%
“…Therefore, this material is regarded as a new generation of high-performance ceramic material and is widely used as substrate materials for high-power electronic devices. [1][2][3] Hao Dong is the co-first author.…”
Section: Introductionmentioning
confidence: 99%
“…Aluminium nitride thin films have gained attention due to their excellent electrical and mechanical properties, namely, their wide bandgap, good piezoelectric response, high resistance to bending, and remarkable thermal and chemical stability, and their optical properties; consequently they found application in sensors, light-emitting diodes, or as insulating layers. [1][2][3][4][5][6][7][8] Emerging devices of great interest are high electron mobility transistors, where AlN layers are used as buffer layers for GaN films to compensate for the misfit of the lattices and the thermal expansion between the substrate and GaN. 9,10 AlN thin films have been deposited using various chemical and physical methods, including metal organic vapor phase epitaxy, ion-beam deposition and magnetron sputtering.…”
Section: Introductionmentioning
confidence: 99%