2007
DOI: 10.1016/j.microrel.2007.07.058
|View full text |Cite
|
Sign up to set email alerts
|

Enhanced finite element modelling of Cu electromigration using ANSYS and matlab

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1

Citation Types

0
1
0

Year Published

2011
2011
2019
2019

Publication Types

Select...
3
2

Relationship

0
5

Authors

Journals

citations
Cited by 5 publications
(1 citation statement)
references
References 9 publications
0
1
0
Order By: Relevance
“…Over the last four decades, there has been a real need for special purpose structural materials, which can withstand huge load for a long duration at a very high temperature. Concentration of stress at the interface becomes more severe as the free surface's approaches [1][2][3]. Essential problems in solid-state bonding are strength of the bond at interface and thermal stress concentration [4 -5].…”
Section: Introductionmentioning
confidence: 99%
“…Over the last four decades, there has been a real need for special purpose structural materials, which can withstand huge load for a long duration at a very high temperature. Concentration of stress at the interface becomes more severe as the free surface's approaches [1][2][3]. Essential problems in solid-state bonding are strength of the bond at interface and thermal stress concentration [4 -5].…”
Section: Introductionmentioning
confidence: 99%