2018
DOI: 10.1007/s11595-018-1816-9
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Enhanced Ferroelectric Polarization in Laser-ablated Bi4Ti3O12 Thin Films by Controlling Preferred Orientation

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Cited by 2 publications
(2 citation statements)
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“…The polarization P increases with decreasing NP size (see Figure 2, curve 2 for x = 0), too. The result is in agreement with the observed experimental data of Wang et al [33] for BiT thin films.…”
Section: Numerical Results and Discussionsupporting
confidence: 93%
“…The polarization P increases with decreasing NP size (see Figure 2, curve 2 for x = 0), too. The result is in agreement with the observed experimental data of Wang et al [33] for BiT thin films.…”
Section: Numerical Results and Discussionsupporting
confidence: 93%
“…However, for ferroelectric device application, films with spontaneous polarization normal to the plane of growth are required. Researchers have paid much attention on epitaxially a/b‐ axes‐oriented Bi 4 Ti 3 O 12 thin films by controlling substrates, buffer layers, deposition conditions, heating rates, and layer thickness . We fabricated Bi 3.15 Nd 0.85 Ti 3 O 12 (BNdT) thin films with 62% a/b ‐axes preferential orientation, 50% c ‐axis orientation, 65(104)/(014) orientation, and random orientation, respectively, on standard‐type Pt/Ti/SiO 2 /Si substrates through a sol–gel process .…”
Section: Scaling Exponents Of Different Ferroelectric Systemsmentioning
confidence: 99%