2023
DOI: 10.1021/acsaelm.3c00537
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Enhanced Energy Storage Performance of Doped Modified PC/PVDF Coblended Flexible Composite Films

Abstract: The rapid development of the clean energy industry has given great impetus to energy-efficient storage and conversion technologies. Film capacitors have attracted much attention because of their higher charge and release rates, greater energy density, and extended life cycle. But the lower recharging and discharging efficiency and insulation properties pertaining to the electricity used in capacitors limit the improvement of their energy storage performance. In this paper, the addition of the linear polymer po… Show more

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Cited by 7 publications
(4 citation statements)
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“…As shown in Figure 2 b, the bilayer dielectric constants films at a frequency of 1 kHz are 7.14, 5.27, and 3.33, respectively. The dielectric constants decreased with increasing BOPP volume fraction in accordance with the theoretical dielectric constant law [ 31 , 32 , 33 ]. The dielectric loss associated with the PVTC/BOPP bilayer film is lower than that of the PVTC film in a given frequency range, which results from the lower dielectric loss of the incorporated BOPP film with linear polarization characteristics.…”
Section: Resultssupporting
confidence: 77%
“…As shown in Figure 2 b, the bilayer dielectric constants films at a frequency of 1 kHz are 7.14, 5.27, and 3.33, respectively. The dielectric constants decreased with increasing BOPP volume fraction in accordance with the theoretical dielectric constant law [ 31 , 32 , 33 ]. The dielectric loss associated with the PVTC/BOPP bilayer film is lower than that of the PVTC film in a given frequency range, which results from the lower dielectric loss of the incorporated BOPP film with linear polarization characteristics.…”
Section: Resultssupporting
confidence: 77%
“…As observed in the figure, the distinctive peaks of the PC outer insulation layer and the PC/PVDF polarization layer, respectively, correlate with the diffraction peaks at 2θ of 17.2 and 20.01°, and no other miscellaneous diffraction peaks are generated. Moreover, the diffraction peaks at 2θ of 27.56, 36.13, 41.3, and 54.34° in the figure correspond to the (110), (101), (111), and (211) crystal planes of TiO 2 , respectively . The reflection peaks’ amplitude keeps increasing given the rise in TiO 2 content in the interlayer, thus proving the introduction of TiO 2 .…”
Section: Resultsmentioning
confidence: 81%
“…Moreover, the diffraction peaks at 2θ of 27.56, 36.13, 41.3, and 54.34°in the figure correspond to the (110), ( 101), (111), and (211) crystal planes of TiO 2 , respectively. 20 The reflection peaks' amplitude keeps increasing given the rise in TiO 2 content in the interlayer, thus proving the introduction of TiO 2 . However, due to the weak diffraction peaks corresponding to the (210), (220), (002), (310), (301), and (112) crystal planes of TiO 2 in the figure, all P-X-P sandwich films did not show the characteristic peaks corresponding to them.…”
Section: Characterization Of P-x-p Sandwich-structuredmentioning
confidence: 91%
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