2013 IEEE 39th Photovoltaic Specialists Conference (PVSC) 2013
DOI: 10.1109/pvsc.2013.6744266
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Enhanced efficiency for voltage matched stacked multi-junction cells: Optimization with yearly temperature and spectra variations

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Cited by 6 publications
(5 citation statements)
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“…All in all, the results show that voltage-matched modules should be the preferred type of area de-coupled modules. This finding is in agreement with the work of Lentine et al [3], [4], who also found that voltagematched tandem devices perform excellent under changing conditions. The reader should bear in mind that the model used in this work does not take non-ideal mechanisms, like the temperature dependence of semiconductor band gaps, into consideration.…”
Section: Discussionsupporting
confidence: 93%
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“…All in all, the results show that voltage-matched modules should be the preferred type of area de-coupled modules. This finding is in agreement with the work of Lentine et al [3], [4], who also found that voltagematched tandem devices perform excellent under changing conditions. The reader should bear in mind that the model used in this work does not take non-ideal mechanisms, like the temperature dependence of semiconductor band gaps, into consideration.…”
Section: Discussionsupporting
confidence: 93%
“…For the other five spectra, there is an overlap between the curves for four-terminal devices and voltage matched area de-coupled modules, while the efficiency of current-matched area de-coupled modules is somewhat lower. This shows the superior spectral flexibility of voltage matched devices, in line with the findings of Lentine et al [3], [4]. Note that the peak efficiency of the series-connected stack is moving from chart to chart.…”
Section: Resultssupporting
confidence: 86%
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“…Various VM module designs have already been evaluated theoretically in the literature. 7,[10][11][12][13][14] The general layout is presented in Fig. 1, where strings of serially connected top cells and strings of serially connected bottom cells are combined in parallel to form a 2T device.…”
Section: Introductionmentioning
confidence: 99%