Enhanced EBSD calibration accuracy based on gradients of diffraction patterns

Shi, Qiwei; Zhong, Hongru; Loisnard, Dominique; Wang, Lei; Chen, Zhe; Wang, Haowei; Roux, Stéphane

doi:10.1016/j.matchar.2023.113022

Cited by 2 publications

(7 citation statements)

References 44 publications

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“…Though the uncertainty level is higher for IDIC-G6 than IDIC6, IDIC-G6&3 achieves slightly better accuracy, ie smaller α m is, than IDIC6&3 (the exact values will be shown in table 1). These results demonstrate that for median-resolution EBSPs, IDIC-G enhances the accuracy yet increases the uncertainty of crystal orientation indexation compared to IDIC [24]. Besides, the refined DI and all versions of IDIC-G and IDIC outperform Hough indexation.…”

Section: Examples Of Accuracy Evaluation For Twinsmentioning

confidence: 66%

“…These two options are referred to by adding the number of parameters, 3 or 6, to the two variants IDIC or IDIC-G. After fitting to a plane, the pattern center (x * , y * , z * ) calibrated by IDIC6 or IDIC-G6 is imposed-and no longer modified-for the IDIC3 and IDIC-G3 based orientation determination [21]. The iterative Gauss-Newton algorithm is used in optimizing the two cost functions, and the detailed formulas are provided in [21,24] respectively.…”

Section: Summary Of Idic Ebsd Indexation Methodsmentioning

confidence: 99%

“…This data set is denoted C in the following. Note that it has been used in our previous works for different purposes [21,24].…”

Section: Acquisitions With Different Tilt Angles θmentioning

confidence: 99%

“…The α mis estimated by IDIC-G EBSD calibration is closer to zero. It has been shown that IDIC-G enhances the PC calibration accuracy, thanks to its least sensitivity to the excess-deficit effect of the Kikuchi bands [24]. As the crystal orientation and PC components are closely correlated in EBSD calibration [16], IDIC-G is also expected to improve the orientation indexation.…”

Section: Acquisitions With Different Tilt Angles θmentioning

confidence: 99%

“…The algorithm is also highly tunable, and the number of targeting parameters can be modified freely to adapt to different scenarios [22,23]. For example, the IDIC variant based on the pattern Gradients (IDIC-G) [24] can be used to accommodate the excess-deficiency effect. Better calibration results are obtained on high-quality EBSPs.…”

Section: Introductionmentioning

confidence: 99%

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Accuracy assessment of crystal orientation indexations by EBSD

Shi,

Loisnard,

et al. 2024

Meas. Sci. Technol.

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Accuracy and uncertainty analyses are essential for every measurement technology. In crystal orientation indexation by electron backscatter diffraction (EBSD), a series of accuracy estimations have been made for the Hough transform and dictionary indexation methods. The mean angular deviation is a standard parameter to indicate orientation accuracy, but this criterion is indirect and closely related to the accuracy of the projection center coordinates. Precise known orientation relationships are necessary to evaluate orientation accuracy without the ground truth. The current work uses the natural crystal twins and hardware orientation relationships to assess the orientation accuracy directly. The accuracy level for different EBSD analysis methods is compared through four experimental data sets of varying pattern definitions and noise levels. It is found that the full pattern match (FPM) algorithms improve the accuracy as compared to Hough indexation, and the gain varies greatly between 14% for fast acquisitions and 20 times for high-quality patterns. Depending on the resolution and quality of diffraction patterns, FPM results in an accuracy of crystal orientation between 0.04° and 0.9°. Comparing the two FPM variants, matching the gradients of diffraction patterns performs better in the case of high-to-median quality acquisitions while matching the pattern itself is more accurate for more noisy and low-definition patterns.

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Section: Examples Of Accuracy Evaluation For Twinsmentioning

confidence: 66%

Section: Summary Of Idic Ebsd Indexation Methodsmentioning

confidence: 99%

“…This data set is denoted C in the following. Note that it has been used in our previous works for different purposes [21,24].…”

Section: Acquisitions With Different Tilt Angles θmentioning

confidence: 99%

Section: Acquisitions With Different Tilt Angles θmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

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Accuracy assessment of crystal orientation indexations by EBSD

Shi,

Loisnard,

et al. 2024

Meas. Sci. Technol.

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3D Reconstruction of a High-Energy Diffraction Microscopy Sample Using Multi-modal Serial Sectioning with High-Precision EBSD and Surface Profilometry

Sparks,

Mason,

Chapman

et al. 2024

Integr Mater Manuf Innov

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High-energy diffraction microscopy (HEDM) combined with in situ mechanical testing is a powerful nondestructive technique for tracking the evolving microstructure within polycrystalline materials during deformation. This technique relies on a sophisticated analysis of X-ray diffraction patterns to produce a three-dimensional reconstruction of grains and other microstructural features within the interrogated volume. However, it is known that HEDM can fail to identify certain microstructural features, particularly smaller grains or twinned regions. Characterization of the identical sample volume using high-resolution surface-specific techniques, particularly electron backscatter diffraction (EBSD), can not only provide additional microstructure information about the interrogated volume but also highlight opportunities for improvement of the HEDM reconstruction algorithms. In this study, a sample fabricated from undeformed “low solvus, high refractory” nickel-based superalloy was scanned using HEDM. The volume interrogated by HEDM was then carefully characterized using a combination of surface-specific techniques, including epi-illumination optical microscopy, zero-tilt secondary and backscattered electron imaging, scanning white light interferometry, and high-precision EBSD. Custom data fusion protocols were developed to integrate and align the microstructure maps captured by these surface-specific techniques and HEDM. The raw and processed data from HEDM and serial sectioning have been made available via the Materials Data Facility (MDF) at https://doi.org/10.18126/4y0p-v604 for further investigation.

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Enhanced EBSD calibration accuracy based on gradients of diffraction patterns

Cited by 2 publications

References 44 publications

Accuracy assessment of crystal orientation indexations by EBSD

Accuracy assessment of crystal orientation indexations by EBSD

3D Reconstruction of a High-Energy Diffraction Microscopy Sample Using Multi-modal Serial Sectioning with High-Precision EBSD and Surface Profilometry

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