1987
DOI: 10.1063/1.98637
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Enhanced Cu-Teflon adhesion by presputtering prior to the Cu deposition

Abstract: Target presputtering effects on stoichiometry and deposition rate of YBaCuO thin films grown by dc magnetron sputtering Appl. Phys. Lett. 52, 1907Lett. 52, (1988; 10.1063/1.99740 Enhanced CuTeflon adhesion by presputtering treatment: Effect of surface morphology changes

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Cited by 116 publications
(45 citation statements)
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“…Previously, the fluoride ion peak at a binding energy of 684 eV in the XPS spectrum was detected when evaporated Cu was thermally annealed for 30 min at 150 C on Teflon AF1600 [29] and when octofluorocyclobutane was plasma polymerized on a Cu substrate. [30] In contrast to evaporated Cu, which can be peeled easily and totally removed from untreated PFA, [9] , FEP [A. R. Guntuka and A. Entenberg, unpublished research] and PTFE, [3,7] the fluoropolymers modified to contain fluoride ions at the interface showed enhanced adhesion to thermally evaporated Cu as reported in Table 4. In addition to these chemical effects, changes in surface roughness during argon etching will also contribute to the better adhesion.…”
Section: Discussionmentioning
confidence: 82%
See 1 more Smart Citation
“…Previously, the fluoride ion peak at a binding energy of 684 eV in the XPS spectrum was detected when evaporated Cu was thermally annealed for 30 min at 150 C on Teflon AF1600 [29] and when octofluorocyclobutane was plasma polymerized on a Cu substrate. [30] In contrast to evaporated Cu, which can be peeled easily and totally removed from untreated PFA, [9] , FEP [A. R. Guntuka and A. Entenberg, unpublished research] and PTFE, [3,7] the fluoropolymers modified to contain fluoride ions at the interface showed enhanced adhesion to thermally evaporated Cu as reported in Table 4. In addition to these chemical effects, changes in surface roughness during argon etching will also contribute to the better adhesion.…”
Section: Discussionmentioning
confidence: 82%
“…[1,2] However, the low surface energy property of fluoropolymers results in poor practical adhesion of evaporated Cu to PTFE, [3][4][5][6][7] FEP [5,6,8] and PFA. [5,6,8,9] Quantitative measurements of the adhesion strengths show stronger adhesion of evaporated copper to FEP and PFA than to PTFE, which is attributed to the larger group electronegativities of CF 3 in FEP and C 3 F 7 O in PFA than to F in PTFE.…”
Section: Introductionmentioning
confidence: 99%
“…In previous reports, the rise in substrate temperature during low-energy X-ray irradiation was reported to be in the tens of degrees. The maximum increase in the substrate temperature during high-energy X-ray irradiation as described in this paper exceeded 200°C [6]. It is not clear whether this was caused by a difference in the energy range, but when the rise in the substrate temperature exceeds 200 °C, different characteristics from those seen in previous research may appear.…”
Section: Large-surface-area Synchrotron Radiationmentioning
confidence: 73%
“…A conventional PTFE surface is inactive and has the problem of not providing sufficient adhesive force for a thin film. Thin film formation by Cu sputtering on PTFE has been reported [6]. In our investigation, activation of the PTFE surface was possible due to plasma surface processing of the PTFE substrate surface as preparation for Cu thin film formation, and the peel strength of the Cu thin film improved dramatically.…”
Section: Metal Film Formation On a Ptfe Substratementioning
confidence: 88%
“…Chang et al [1][2][3] utilized a presputtering technique to improve the adhesion of PTFE films to a deposed copper layer. The adhesion enhancement was attributed to morphology changes of the PTFE film surface.…”
Section: Introductionmentioning
confidence: 99%