2017
DOI: 10.1016/j.ceramint.2016.12.063
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Enhanced conductance properties of UV laser/RTA annealed Al-doped ZnO thin films

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Cited by 21 publications
(6 citation statements)
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“…Additionally, and for the purpose of this review, we are interested in the thermal effects induced upon LA, thus we are focusing our attention to the ns pulse regime; nevertheless. Nevertheless, the utilization of ps, fs, and CW lasers for metal‐oxide film processing is additionally reported. It is, therefore, worth addressing the connection between CW and pulsed LA, as a scanning CW process shares similar principles with pulsed LA albeit with significantly lower peak power, defined by the scanning speed and laser spot size rendering a ms interaction with the film (in contrast to the typical ns pulses provided by excimer lasers).…”
Section: Laser Annealingmentioning
confidence: 99%
“…Additionally, and for the purpose of this review, we are interested in the thermal effects induced upon LA, thus we are focusing our attention to the ns pulse regime; nevertheless. Nevertheless, the utilization of ps, fs, and CW lasers for metal‐oxide film processing is additionally reported. It is, therefore, worth addressing the connection between CW and pulsed LA, as a scanning CW process shares similar principles with pulsed LA albeit with significantly lower peak power, defined by the scanning speed and laser spot size rendering a ms interaction with the film (in contrast to the typical ns pulses provided by excimer lasers).…”
Section: Laser Annealingmentioning
confidence: 99%
“…J. Kim et al showed that the UV irradiation can improve structural properties significantly as well [23]. A. C. Marques et al investigated the power output density of AZO thin films under UV light and found it to be increased during exposure of the films to UV-light, due to the photo-thermoelectric effect [24].…”
Section: Introductionmentioning
confidence: 99%
“…J. Kim et al. showed that the UV irradiation can improve structural properties significantly as well [ 23 ]. A. C. Marques et al.…”
Section: Introductionmentioning
confidence: 99%
“…Moreover, during the RTA process, nitrogen release from the ZnO:N layer is less probable. It has been shown that the RTA method is a particularly suitable method for improving the structural, optical, and electrical properties of ZnO films [ 21 , 22 ].…”
Section: Introductionmentioning
confidence: 99%