ENFSI Proficiency Test Program on Identification of GSR by SEM/EDX

Niewoehner, Ludwig; Wenz, Heinrich; Andrasko, Jan; Beijer, Renske P. de; Gunaratnam, Lawrence

doi:10.1520/jfs2002396

Cited by 15 publications

(18 citation statements)

References 6 publications

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“…Improvements of analytical equipment and comparative testing continuously refine the minimal analytical values (e.g. [27]). Additionally, measures against contamination of the sample, incorrect specimen and equipment handling or misinterpretation of a given particle are ( [8,17,18]; see also [3]).…”

Section: Discussionmentioning

confidence: 99%

Distribution of gunshot residues – The influence of weapon type

Ditrich¹

2012

Forensic Science International

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Section: Discussionmentioning

confidence: 99%

Distribution of gunshot residues – The influence of weapon type

Ditrich¹

2012

Forensic Science International

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“…The optimization process of SEMs for GSR analysis may be performed on the synthetic ‘GSR‐like’ sample, or on a realistic sample, containing both GSR particles and various environmental particles. On the basis of the intrinsic differences between these two types of samples (Table ), it was decided to use a previously analyzed (by the W‐filament SEM) casework sample, collected from the hands of a suspect, containing several GSR particles.…”

Section: Instrumentation and Methodsmentioning

confidence: 99%

“…The performance of GSR automated systems may be evaluated on the basis of standard test samples, such as the European Network of Forensic Science Institutes (ENFSI) GSR proficiency test (PT) samples . These artificial GSR‐like samples were produced using selected semiconductor technology processes and are widely used as quality assurance measures in forensic science laboratories.…”

Section: Introductionmentioning

confidence: 99%

Optimizing FEG‐SEM combined with an SDD EDX system for automated GSR analysis

Izraeli¹,

Tsach²,

Levin³

2013

X-Ray Spectrometry

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Gunshot residue (GSR) analysis by scanning electron microscopy/energy dispersive x‐ray spectrometry (SEM/EDX) is routinely performed in forensic science laboratories. At the end of 2011, a field emission gun (FEG)‐SEM was installed at the authors' laboratory for this type of examination. Following the installation of the FEG‐SEM, an extensive process was conducted, in order to determine the optimal operating parameters of this instrument for GSR analysis. Because the nature of synthetic GSR samples (such as the European Network of Forensic Science Institutes GSR2011 proficiency test sample) is significantly different from casework samples, it was decided not to use them for this purpose. Instead, a GSR casework sample, previously analyzed by tungsten‐filament SEM as part of the laboratory's routine examinations, was selected. This sample was repeatedly analyzed (more than 200 times), under different operating conditions. The main parameters that were examined for the FEG‐SEM were the electron source accelerating voltage, the backscattered electrons image acquisition time, the magnification, the backscattered electrons image resolution, and the energy‐dispersive X‐ray spectrometry acquisition time. The smallest detected feature was calculated by the software, based on the set image resolution and magnification. For each set of parameters, the detected GSR particles were recorded, in addition to the total number of detected particles and the time taken for the run. It was found that for a given smallest detected feature, the effective search conditions were higher magnification and lower number of pixels per line. The present work includes a detailed description of the optimization process and its results. The process utilized in this work is applicable for other laboratories conducting similar type of GSR analysis as well. Copyright © 2013 John Wiley & Sons, Ltd.

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“…Another prominent example can be found in the field of forensic analytics. Here, the fabrication of artificial gunshot residues (GSR) is crucial in order to evaluate automated systems that are used in the analysis during an investigation (Niewoehner et al ., ). When a handgun or rifle is fired, a cloud of microscopic particles with characteristic size (approx.…”

Section: Introductionmentioning

confidence: 99%

Challenging material patterning: Fine lithography on coarse substrates

et al. 2013

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Precise patterning of inorganic materials is important for many technological applications. Often lithography processes are required on challenging substrates with respect to topography, flexibility, and surface adhesion. Here we show the fabrication of artificial gunshot residues (GSR) on adhesive tape samples by means of dip-pen lithography as an example for fine lithography on coarse substrates. We deposited lead-, barium-, and antimony-containing inks on SEM adhesive tape by direct writing with a fine tip. Single as well as multiple element structures with dimensions in the range of 10-75 µm were fabricated.

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ENFSI Proficiency Test Program on Identification of GSR by SEM/EDX

Cited by 15 publications

References 6 publications

Distribution of gunshot residues – The influence of weapon type

Distribution of gunshot residues – The influence of weapon type

Optimizing FEG‐SEM combined with an SDD EDX system for automated GSR analysis

Challenging material patterning: Fine lithography on coarse substrates

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